Inventor · disambiguated record
Kwame Amponsah
Also filed as: AMPONSAH KWAME
14 granted patents·6 pending applications·17 citations·filing 2011–2024
87Inventor score
Top patents by PatentIndex Score
20 records- 0192US10048289B2Motion sensor integrated nano-probe N/MEMS apparatus, method, and applicationsUNIV CORNELL·Filed 2012·Granted Aug 14, 2018·12 cites·21 claims
- 0287US10613115B2Multiple integrated tips scanning probe microscopeXALLENT LLC·Filed 2018·Granted Apr 7, 2020·2 cites·2 claims
- 0387US10436814B2Systems and methods for manufacturing nano-electro-mechanical-system probesXALLENT LLC·Filed 2016·Granted Oct 8, 2019·2 cites·8 claims
- 0472US10545171B2Systems and methods for manufacturing nano-electro-mechanical-system probesXALLENT LLC·Filed 2019·Granted Jan 28, 2020·0 cites·5 claims
- 0571US2023143037A1Systems and methods for manufacturing nano-electro-mechanical-system probesXALLENT INC·Filed 2022·Application pending·0 cites
- 0668US11573247B2Systems and methods for manufacturing nano-electro-mechanical-system probesXALLENT INC·Filed 2021·Granted Feb 7, 2023·0 cites·7 claims
- 0767US11125774B2Systems and methods for manufacturing nano-electro-mechanical-system probesXALLENT LLC·Filed 2020·Granted Sep 21, 2021·0 cites·8 claims
- 0866US11280825B2Functional prober chipXALLENT LLC·Filed 2020·Granted Mar 22, 2022·0 cites·8 claims
- 0965US11017959B2Nanoelectromechanical devices with metal-to-metal contactsAMPONSAH KWAME·Filed 2020·Granted May 25, 2021·0 cites·10 claims
- 1065US10895585B2Multiple integrated tips scanning probe microscopeXALLENT LLC·Filed 2020·Granted Jan 19, 2021·0 cites·2 claims
- 1163US2019018039A1Motion sensor integrated nano-probe n/mems apparatus, method, and applicationsUNIV CORNELL·Filed 2018·Application pending·0 cites
- 1259US9159710B2Structures and methods for electrically and mechanically linked monolithically integrated transistor and NEMS/MEMS deviceLAL AMIT·Filed 2011·Granted Oct 13, 2015·1 cites·26 claims
- 1356US10784054B2Nanoelectromechanical devices with metal-to-metal contactsAMPONSAH KWAME·Filed 2018·Granted Sep 22, 2020·0 cites·15 claims
- 1456US2016252545A1Multiple Integrated Tips Scanning Probe MicroscopeXALLENT LLC·Filed 2016·Application pending·0 cites
- 1555US10663484B2Multiple integrated tips scanning probe microscope with pre-alignment componentsXALLENT LLC·Filed 2018·Granted May 26, 2020·0 cites·20 claims
- 1653US12085589B2Fine pitch probe cardXALLENT INC·Filed 2020·Granted Sep 10, 2024·0 cites·11 claims
- 1753US2024255571A1Methods and techniques for determining when a probe tip is proximate to or in contact with a sample surfaceXALLENT INC·Filed 2024·Application pending·0 cites
- 1851US10866273B2Functional prober chipXALLENT LLC·Filed 2017·Granted Dec 15, 2020·0 cites·11 claims
- 1944US2025199287A1Microscope objective adapter for testing semiconductors and thin film materialsXALLENT INC·Filed 2023·Application pending·0 cites
- 2040US2024310410A1Probe head with replaceable probe boardXALLENT INC·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →