Inventor · disambiguated record
Christopher Sears
Also filed as: SEARS CHRISTOPHER · SEARS CHRISTOPHER M · SEARS CHRISTOPHER MALCOLM STANLEY
30 granted patents·1 pending application·138 citations·filing 2010–2022
96Inventor score
Top patents by PatentIndex Score
31 records- 0194US11056312B1Micro stigmator array for multi electron beam systemKLA CORP·Filed 2020·Granted Jul 6, 2021·6 cites·30 claims
- 0293US8513619B1Non-planar extractor structure for electron sourceNASSER-GHODSI MEHRAN·Filed 2012·Granted Aug 20, 2013·20 cites·17 claims
- 0392US9805910B1Automated SEM nanoprobe toolKLA-TENCOR TECH CORP·Filed 2015·Granted Oct 31, 2017·17 cites·29 claims
- 0491US10096447B1Electron beam apparatus with high resolutionsKLA TENCOR CORP·Filed 2017·Granted Oct 9, 2018·12 cites·18 claims
- 0590US10276346B1Particle beam inspector with independently-controllable beamsKLA TENCOR CORP·Filed 2016·Granted Apr 30, 2019·9 cites·41 claims
- 0689US11335608B2Electron beam system for inspection and review of 3D devicesKLA CORP·Filed 2021·Granted May 17, 2022·2 cites·20 claims
- 0789US8455838B2Multiple-column electron beam apparatus and methodsSHADMAN KHASHAYAR·Filed 2012·Granted Jun 4, 2013·13 cites·21 claims
- 0887US12165831B2Method and system of image-forming multi-electron beamsKLA CORP·Filed 2022·Granted Dec 10, 2024·1 cites·22 claims
- 0987US8698094B1Permanent magnet lens arraySEARS CHRISTOPHER·Filed 2011·Granted Apr 15, 2014·19 cites·23 claims
- 1085US10748739B2Deflection array apparatus for multi-electron beam systemKLA TENCOR CORP·Filed 2018·Granted Aug 18, 2020·4 cites·36 claims
- 1184US9443693B2Notched magnetic lens for improved sample access in an SEMKLA TENCOR CORP·Filed 2015·Granted Sep 13, 2016·3 cites·23 claims
- 1281US9934933B1Extractor electrode for electron sourceKLA TENCOR CORP·Filed 2017·Granted Apr 3, 2018·3 cites·20 claims
- 1380US10090131B2Method and system for aberration correction in an electron beam systemKLA TENCOR CORP·Filed 2016·Granted Oct 2, 2018·3 cites·44 claims
- 1480US10056224B2Method and system for edge-of-wafer inspection and reviewKLA TENCOR CORP·Filed 2016·Granted Aug 21, 2018·3 cites·27 claims
- 1579US10354832B2Multi-column scanning electron microscopy systemKLA TENCOR CORP·Filed 2017·Granted Jul 16, 2019·3 cites·37 claims
- 1679US8421030B2Charged-particle energy analyzerSHADMAN KHASHAYAR·Filed 2010·Granted Apr 16, 2013·6 cites·21 claims
- 1777US8633457B2Background reduction system including louverNASSER-GHODSI MEHRAN·Filed 2011·Granted Jan 21, 2014·4 cites·16 claims
- 1876US10964522B2High resolution electron energy analyzerKLA TENCOR CORP·Filed 2019·Granted Mar 30, 2021·2 cites·26 claims
- 1971US9513230B2Apparatus and method for optical inspection, magnetic field and height mappingKLA TENCOR CORP·Filed 2013·Granted Dec 6, 2016·3 cites·22 claims
- 2071US8921782B2Tilt-imaging scanning electron microscopeKLA TENCOR CORP·Filed 2013·Granted Dec 30, 2014·2 cites·19 claims
- 2169US8658973B2Auger elemental identification algorithmNEIL MARK·Filed 2013·Granted Feb 25, 2014·3 cites·20 claims
- 2262US11651934B2Systems and methods of creating multiple electron beamsKLA CORP·Filed 2021·Granted May 16, 2023·0 cites·20 claims
- 2358US12451319B2Electron source with magnetic suppressor electrodeKLA CORP·Filed 2020·Granted Oct 21, 2025·0 cites·12 claims
- 2455US11037753B2Magnetically microfocused electron emission sourceKLA TENCOR CORP·Filed 2019·Granted Jun 15, 2021·0 cites·14 claims
- 2554US10770258B2Method and system for edge-of-wafer inspection and reviewKLA TENCOR CORP·Filed 2018·Granted Sep 8, 2020·0 cites·19 claims
- 2653US11508591B2High resolution electron beam apparatus with dual-aperture schemesKLA CORP·Filed 2021·Granted Nov 22, 2022·0 cites·21 claims
- 2749US2023245933A1Combining focused ion beam milling and scanning electron microscope imagingKLA CORP·Filed 2022·Application pending·0 cites
- 2847US9881764B2Heat-spreading blanking system for high throughput electron beam apparatusKLA TENCOR CORP·Filed 2016·Granted Jan 30, 2018·0 cites·20 claims
- 2946US11302510B2Space charge insensitive electron gun designsKLA TENCOR CORP·Filed 2018·Granted Apr 12, 2022·0 cites·16 claims
- 3043US12165838B2Joint electron-optical columns for flood-charging and image-forming in voltage contrast wafer inspectionsKLA CORP·Filed 2019·Granted Dec 10, 2024·0 cites·28 claims
- 3140US10224177B2Method and system for aberration correction in an electron beam systemKLA TENCOR CORP·Filed 2016·Granted Mar 5, 2019·0 cites·40 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →