Inventor · disambiguated record
Kristiaan Van Rossen
Also filed as: VAN ROSSEN KRISTIAAN
2 granted patents·2 pending applications·2 citations·filing 2011–2024
33Inventor score
Top patents by PatentIndex Score
4 records- 0168US2025146964A1Thermal imaging method for crack and hole detection in semiconductor devicesORBOTECH LTD·Filed 2024·Application pending·0 cites
- 0246US9255893B2Apparatus for illuminating substrates in order to image micro cracks, pinholes and inclusions in monocrystalline and polycrystalline substrates and method thereforeGRZEGORCZYK WOJCIECH·Filed 2011·Granted Feb 9, 2016·2 cites·26 claims
- 0340US11340284B2Combined transmitted and reflected light imaging of internal cracks in semiconductor devicesKLA CORP·Filed 2020·Granted May 24, 2022·0 cites·20 claims
- 0425US2013035881A1Method and system for characterizing efficiency impact of interruption defects in photovoltaic cellsKLA TENCOR CORP·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →