Inventor · disambiguated record
Thomas Iffland
Also filed as: IFFLAND THOMAS
2 granted patents·7 pending applications·8 citations·filing 2004–2009
51Inventor score
Files withLEICA MICROSYSTEMS5VISTEC SEMICONDUCTOR SYSTEMS J2CHROMASENS GMBH1VISTEC SEMICONDUCTOR SYS GMBH1
Top patents by PatentIndex Score
9 records- 0155US7041952B2Method for automatic focusing an imaging optical system on the surface of a sampleLEICA MICROSYSTEMS·Filed 2004·Granted May 9, 2006·7 cites·4 claims
- 0254US7411665B2Method for wavelength calibration of an optical measurement systemLEICA MICROSYSTEMS·Filed 2006·Granted Aug 12, 2008·1 cites·8 claims
- 0338US2009237653A1Device for recording a number of images of disk-shaped objectsCHROMASENS GMBH·Filed 2006·Application pending·0 cites
- 0437US2006119366A1System for inspection of a disk-shaped objectLEICA MICROSYSTEMS·Filed 2005·Application pending·0 cites
- 0536US2009309285A1Device for holding disk-shaped objectsVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2009·Application pending·0 cites
- 0635US2008203636A1Apparatus for holding disk-like objectsVISTEC SEMICONDUCTOR SYSTEMS J·Filed 2008·Application pending·0 cites
- 0732US2005225632A1Apparatus and method for acquiring a complete image of a surface of a semiconductor substrateLEICA MICROSYSTEMS·Filed 2005·Application pending·0 cites
- 0831US2008208523A1Method of determining geometric parameters of a waferVISTEC SEMICONDUCTOR SYS GMBH·Filed 2008·Application pending·0 cites
- 0930US2006119367A1Apparatus for Inspecting the front side and backside of a disk-shaped objectLEICA MICROSYSTEMS·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →