Inventor · disambiguated record
Eric Graetz
Also filed as: GRAETZ ERIC · GRAETZ ERIC ALOIS
6 granted patents·4 pending applications·85 citations·filing 2010–2025
75Inventor score
Top patents by PatentIndex Score
10 records- 0196US8835978B2Lateral transistor on polymerMAUDER ANTON·Filed 2012·Granted Sep 16, 2014·84 cites·25 claims
- 0267US10741402B2Electronic device, electronic module and methods for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2017·Granted Aug 11, 2020·1 cites·13 claims
- 0363US11615963B2Electronic device, electronic module and methods for fabricating the sameINFINEON TECHNOLOGIES AG·Filed 2020·Granted Mar 28, 2023·0 cites·20 claims
- 0462US2025280558A1Semiconductor die having a variable thickness device layerINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2025·Application pending·0 cites
- 0561US12328891B2Silicon-on-insulator (SOI) device having variable thickness device layer and corresponding method of productionINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2022·Granted Jun 10, 2025·0 cites·14 claims
- 0646US2014035094A1Semiconductor structureINFINEON TECHNOLOGIES AG·Filed 2013·Application pending·0 cites
- 0742US2023197846A1Power semiconductor device and methods of producing a power semiconductor deviceINFINEON TECHNOLOGIES AUSTRIA AG·Filed 2021·Application pending·0 cites
- 0841US2015262814A1Power semiconductor device,power electronic module, and method for processing a power semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2014·Application pending·0 cites
- 0938US8518798B2Semiconductor structure and method for making sameGRAETZ ERIC·Filed 2010·Granted Aug 27, 2013·0 cites·35 claims
- 1024US9658279B2Contactless damage inspection of perimeter region of semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2015·Granted May 23, 2017·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →