Inventor · disambiguated record
Jengwei Pan
Also filed as: PAN JENGWEI
2 granted patents·27 citations·filing 1996–1997
58Inventor score
Files withS3 INC1
Top patents by PatentIndex Score
2 records- 0161US5951702ARAM-like test structure superimposed over rows of macrocells with added differential pass transistors in a CPUS3 INC·Filed 1997·Granted Sep 14, 1999·24 cites·18 claims
- 0224US5546320AMethod for performing integrated section-level and full-chip timing verification for custom microprocessor designsFiled 1996·Granted Aug 13, 1996·3 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →