Inventor · disambiguated record
Shigeki Kurihara
Also filed as: KURIHARA SHIGEKI
6 granted patents·2 pending applications·17 citations·filing 1999–2014
75Inventor score
Top patents by PatentIndex Score
8 records- 0177US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0252US10118580B2Structure of underrun protectionDAIMLER AG·Filed 2014·Granted Nov 6, 2018·1 cites·6 claims
- 0351US8139845B2Evaluation object pattern determining apparatus, evaluation object pattern determining method, evaluation object pattern determining program and pattern evaluating systemNOGUCHI TAKASHI·Filed 2008·Granted Mar 20, 2012·2 cites·11 claims
- 0446US10286866B2Structure of underrun protectionDAIMLER AG·Filed 2014·Granted May 14, 2019·0 cites·10 claims
- 0545US9764707B2Structure of underrun protectionDAIMLER AG·Filed 2014·Granted Sep 19, 2017·0 cites·8 claims
- 0636US2002141553A1Transmission line rerouting method, subscriber line accommodating apparatus and trunk transmission line accommodating apparatusFiled 2001·Application pending·0 cites
- 0735US6506968B1Sound source deviceROHM CO LTD·Filed 1999·Granted Jan 14, 2003·7 cites·17 claims
- 0830US2011296362A1Semiconductor defect integrated projection method and defect inspection support apparatus equipped with semiconductor defect integrated projection functionISHIKAWA TAMAO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →