Assignee
SAKAI TSUNEHIRO
JP·1 granted patent·1 pending application·7 citations·filing 2010–2011
Top patents by PatentIndex Score
2 records- 0177US8995748B2Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying methodSAKAI TSUNEHIRO·Filed 2010·Granted Mar 31, 2015·7 cites·13 claims
- 0232US2013283227A1Pattern review tool, recipe making tool, and method of making recipeSAKAI TSUNEHIRO·Filed 2011·Application pending·0 cites
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