Inventor · disambiguated record
Hidefumi Ibe
Also filed as: IBE HIDEFUMI
11 granted patents·110 citations·filing 1979–2011
89Inventor score
Top patents by PatentIndex Score
11 records- 0183US5369674APlant diagnosis apparatus and methodHITACHI LTD·Filed 1992·Granted Nov 29, 1994·27 cites·44 claims
- 0272US5398268ANuclear power plant having a water chemistry control system for a primary cooling system thereof and an operation method thereofHITACHI LTD·Filed 1992·Granted Mar 14, 1995·18 cites·23 claims
- 0362US4380168ASodium leakage detection system and method of controlling the sameHITACHI LTD·Filed 1980·Granted Apr 19, 1983·18 cites·11 claims
- 0458US6762422B2Analyzer/observerHITACHI LTD·Filed 2000·Granted Jul 13, 2004·6 cites·9 claims
- 0557US4366438ASodium ionization detectorHITACHI LTD·Filed 1979·Granted Dec 28, 1982·13 cites·3 claims
- 0650US4578154AMethod and apparatus for measuring dissolved gas concentrationsHITACHI LTD·Filed 1985·Granted Mar 25, 1986·15 cites·20 claims
- 0745US5201229ASensor for controlling water quality of reactor and method of controlling said water chemistryHITACHI LTD·Filed 1990·Granted Apr 13, 1993·12 cites·20 claims
- 0842US7395168B2Method for evaluating semiconductor device error and system for supporting the sameRENESAS TECH CORP·Filed 2005·Granted Jul 1, 2008·1 cites·2 claims
- 0936US9507895B2Simulation apparatus and simulation method for determining soft error rates for a configured modelTOBA TADANOBU·Filed 2011·Granted Nov 29, 2016·0 cites·9 claims
- 1036US8904233B2Electronic apparatusIBE HIDEFUMI·Filed 2011·Granted Dec 2, 2014·0 cites·9 claims
- 1133US8892967B2Measurement device and measurement methodIBE HIDEFUMI·Filed 2010·Granted Nov 18, 2014·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →