Assignee
TOBA TADANOBU
JP·1 granted patent·2 pending applications·0 citations·filing 2009–2012
Top patents by PatentIndex Score
3 records- 0141US2011279143A1Semiconductor wafer testing apparatusTOBA TADANOBU·Filed 2009·Application pending·0 cites
- 0236US9507895B2Simulation apparatus and simulation method for determining soft error rates for a configured modelTOBA TADANOBU·Filed 2011·Granted Nov 29, 2016·0 cites·9 claims
- 0329US2014164839A1Programmable device, method for reconfiguring programmable device, and electronic deviceTOBA TADANOBU·Filed 2012·Application pending·0 cites
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