Inventor · disambiguated record
Allan Gleason
Also filed as: GLEASON ALLAN
17 granted patents·2 pending applications·1,716 citations·filing 1996–2013
96Inventor score
Top patents by PatentIndex Score
19 records- 0199US6280290B1Method of forming a transparent window in a polishing padAPPLIED MATERIALS INC·Filed 2000·Granted Aug 28, 2001·165 cites·15 claims
- 0299US6045439AForming a transparent window in a polishing pad for a chemical mechanical polishing apparatusAPPLIED MATERIALS INC·Filed 1999·Granted Apr 4, 2000·228 cites·20 claims
- 0399US5893796AForming a transparent window in a polishing pad for a chemical mechanical polishing apparatusAPPLIED MATERIALS INC·Filed 1996·Granted Apr 13, 1999·739 cites·18 claims
- 0498US6537133B1Method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 2000·Granted Mar 25, 2003·161 cites·5 claims
- 0597US7255629B2Polishing assembly with a windowAPPLIED MATERIALS INC·Filed 2006·Granted Aug 14, 2007·24 cites·15 claims
- 0696US7118450B2Polishing pad with window and method of fabricating a window in a polishing padAPPLIED MATERIALS INC·Filed 2005·Granted Oct 10, 2006·19 cites·17 claims
- 0796US6676717B1Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 2000·Granted Jan 13, 2004·58 cites·27 claims
- 0893US6910944B2Method of forming a transparent window in a polishing padAPPLIED MATERIALS INC·Filed 2001·Granted Jun 28, 2005·28 cites·45 claims
- 0990US6719818B1Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 1998·Granted Apr 13, 2004·92 cites·3 claims
- 1089US6390904B1Retainers and non-abrasive liners used in chemical mechanical polishingAPPLIED MATERIALS INC·Filed 1998·Granted May 21, 2002·103 cites·25 claims
- 1187US7011565B2Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatusAPPLIED MATERIALS INC·Filed 2003·Granted Mar 14, 2006·22 cites·41 claims
- 1282US6876454B1Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 1999·Granted Apr 5, 2005·44 cites·76 claims
- 1378US6875078B2Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 2003·Granted Apr 5, 2005·15 cites·13 claims
- 1477US8795029B2Apparatus and method for in-situ endpoint detection for semiconductor processing operationsAPPLIED MATERIALS INC·Filed 2013·Granted Aug 5, 2014·2 cites·12 claims
- 1575US6860791B2Polishing pad for in-situ endpoint detectionAPPLIED MATERIALS INC·Filed 2003·Granted Mar 1, 2005·14 cites·26 claims
- 1668US8506356B2Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsBIRANG MANOOCHER·Filed 2010·Granted Aug 13, 2013·1 cites·12 claims
- 1766US7775852B2Apparatus and method for in-situ endpoint detection for chemical mechanical polishing operationsAPPLIED MATERIALS INC·Filed 2005·Granted Aug 17, 2010·1 cites·11 claims
- 1858US2014038501A1Transparent window in a polishing padAPPLIED MATERIALS INC·Filed 2013·Application pending·0 cites
- 1954US2007015441A1Apparatus and Method for In-Situ Endpoint Detection for Chemical Mechanical Polishing OperationsAPPLIED MATERIALS INC·Filed 2006·Application pending·0 cites
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