Inventor · disambiguated record
Per-Ove Hansson
Also filed as: HANSSON PER-OVE · HANSSON PER-OVE DR
4 granted patents·4 pending applications·74 citations·filing 1994–2006
76Inventor score
Files withAPPLIED MATERIALS INC3WACKER SILTRONIC HALBLEITERMAT2COX DAMON K1MAX PLANCK GESELLSCHAFT1THAKUR RANDHIR1
Top patents by PatentIndex Score
8 records- 0171US7745309B2Methods for surface activation by plasma immersion ion implantation process utilized in silicon-on-insulator structureAPPLIED MATERIALS INC·Filed 2006·Granted Jun 29, 2010·5 cites·23 claims
- 0268US6316361B1CVD reactor and process for producing an epitally coated semiconductor waferWACKER SILTRONIC HALBLEITERMAT·Filed 1999·Granted Nov 13, 2001·26 cites·2 claims
- 0366US6217212B1Method and device for detecting an incorrect position of a semiconductor waferWACKER SILTRONIC HALBLEITERMAT·Filed 1998·Granted Apr 17, 2001·41 cites·5 claims
- 0443US2008268617A1Methods for substrate surface cleaning suitable for fabricating silicon-on-insulator structuresAPPLIED MATERIALS INC·Filed 2006·Application pending·0 cites
- 0542US2007134821A1Cluster tool for advanced front-end processingTHAKUR RANDHIR·Filed 2006·Application pending·0 cites
- 0640US2007089836A1Semiconductor process chamberAPPLIED MATERIALS INC·Filed 2005·Application pending·0 cites
- 0737US2007196011A1Integrated vacuum metrology for cluster toolCOX DAMON K·Filed 2006·Application pending·0 cites
- 0827US5513593ALiquid-phase heteroepitaxy methodMAX PLANCK GESELLSCHAFT·Filed 1994·Granted May 7, 1996·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →