Inventor · disambiguated record
Nissim Elmaliach
Also filed as: ELMALIACH NISSIM
7 granted patents·193 citations·filing 1997–2012
88Inventor score
Top patents by PatentIndex Score
7 records- 0195US7468506B2Spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·55 cites·20 claims
- 0294US7468507B2Optical spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·37 cites·18 claims
- 0386US9702983B2Multi-spot collection opticsEDER HAIM·Filed 2012·Granted Jul 11, 2017·29 cites·20 claims
- 0483US6809808B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2002·Granted Oct 26, 2004·23 cites·25 claims
- 0571US6853475B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted Feb 8, 2005·11 cites·9 claims
- 0669US7053395B2Wafer defect detection system with traveling lens multi-beam scannerAPPLIED MATERIALS INC·Filed 2003·Granted May 30, 2006·10 cites·7 claims
- 0755US6366687B1Data converter apparatus and method particularly useful for a database-to-object inspection systemAPPLIED MATERIALS INC·Filed 1997·Granted Apr 2, 2002·28 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →