Inventor · disambiguated record
Arvind Kumar
Also filed as: KUMAR ARVIND · KUMAR ARVIND A
235 granted patents·57 pending applications·1,539 citations·filing 1997–2025
99Inventor score
Top patents by PatentIndex Score
292 records- 0198US11782488B2Methods and apparatus to operate closed-lid portable computersINTEL CORP·Filed 2022·Granted Oct 10, 2023·9 cites·24 claims
- 0297US9577061B2Asymmetric high-K dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Feb 21, 2017·11 cites·4 claims
- 0397US9570354B2Asymmetric high-K dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Feb 14, 2017·12 cites·14 claims
- 0497US9412667B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2014·Granted Aug 9, 2016·22 cites·17 claims
- 0597US9111993B1Conductive trench isolationOMNIVISION TECH INC·Filed 2014·Granted Aug 18, 2015·29 cites·12 claims
- 0696US12197357B2High performance interconnectINTEL CORP·Filed 2021·Granted Jan 14, 2025·2 cites·20 claims
- 0796US11379016B2Methods and apparatus to operate closed-lid portable computersINTEL CORP·Filed 2019·Granted Jul 5, 2022·18 cites·30 claims
- 0896US9934138B1Application testing on a blockchainIBM·Filed 2016·Granted Apr 3, 2018·64 cites·20 claims
- 0996US9859122B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2017·Granted Jan 2, 2018·7 cites·7 claims
- 1096US9768195B2Semiconductor structure with integrated passive structuresIBM·Filed 2016·Granted Sep 19, 2017·8 cites·16 claims
- 1196US9685379B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Jun 20, 2017·9 cites·8 claims
- 1296US9543213B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Jan 10, 2017·10 cites·12 claims
- 1396US7718496B2Techniques for enabling multiple Vt devices using high-K metal gate stacksIBM·Filed 2007·Granted May 18, 2010·32 cites·5 claims
- 1495US11809535B2Systems and methods for multi-modal user device authenticationINTEL CORP·Filed 2019·Granted Nov 7, 2023·16 cites·21 claims
- 1595US11483776B1Systems and methods for dynamic per-beam adjustment of output power in a wireless networkVERIZON PATENT & LICENSING INC·Filed 2021·Granted Oct 25, 2022·5 cites·20 claims
- 1695US9768071B2Asymmetric high-K dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Sep 19, 2017·6 cites·16 claims
- 1795US9559010B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Jan 31, 2017·7 cites·7 claims
- 1895US8030145B2Back-gated fully depleted SOI transistorIBM·Filed 2010·Granted Oct 4, 2011·23 cites·21 claims
- 1994US11101318B2Back-side memory element with local memory select transistorIBM·Filed 2019·Granted Aug 24, 2021·14 cites·4 claims
- 2094US10446606B2Back-side memory element with local memory select transistorIBM·Filed 2017·Granted Oct 15, 2019·13 cites·6 claims
- 2194US9922831B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2017·Granted Mar 20, 2018·5 cites·9 claims
- 2294US9721843B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Aug 1, 2017·6 cites·13 claims
- 2394US9626321B2High performance interconnectINTEL CORP·Filed 2013·Granted Apr 18, 2017·14 cites·1 claims
- 2494US9627480B2Junction butting structure using nonuniform trench shapeGLOBALFOUNDRIES INC·Filed 2014·Granted Apr 18, 2017·13 cites·11 claims
- 2594US8212322B2Techniques for enabling multiple Vt devices using high-K metal gate stacksFRANK MARTIN M·Filed 2010·Granted Jul 3, 2012·16 cites·18 claims
- 2693US10248591B2High performance interconnectINTEL CORP·Filed 2016·Granted Apr 2, 2019·5 cites·23 claims
- 2793US9450072B2Replacement gate structure for enhancing conductivityGLOBALFOUNDRIES INC·Filed 2014·Granted Sep 20, 2016·11 cites·16 claims
- 2893US6337497B1Common source transistor capacitor stackIBM·Filed 1997·Granted Jan 8, 2002·100 cites·3 claims
- 2992US11741030B2High performance interconnectINTEL CORP·Filed 2020·Granted Aug 29, 2023·2 cites·20 claims
- 3092US10367072B2Asymmetric high-k dielectric for reducing gate induced drain leakageIBM·Filed 2017·Granted Jul 30, 2019·3 cites·13 claims
- 3191US11874710B2Methods and apparatus to operate closed-lid portable computersINTEL CORP·Filed 2023·Granted Jan 16, 2024·1 cites·28 claims
- 3291US11175844B1Optimal placement of data structures in a hybrid memory based inference computing platformIBM·Filed 2020·Granted Nov 16, 2021·3 cites·17 claims
- 3391US9400511B1Methods and control systems of resistance adjustment of resistorsIBM·Filed 2016·Granted Jul 26, 2016·6 cites·18 claims
- 3491US9269786B2Silicon nitride layer deposited at low temperature to prevent gate dielectric regrowth high-K metal gate field effect transistorsGLOBALFOUNDRIES INC·Filed 2013·Granted Feb 23, 2016·13 cites·20 claims
- 3590USD847810SComputer notebookINTEL CORP·Filed 2018·Granted May 7, 2019·23 cites·1 claims
- 3690US10192161B1Lithium-drift based resistive processing unit for accelerating machine learning trainingIBM·Filed 2017·Granted Jan 29, 2019·10 cites·20 claims
- 3790US9837319B2Asymmetric high-K dielectric for reducing gate induced drain leakageIBM·Filed 2016·Granted Dec 5, 2017·3 cites·13 claims
- 3890US7417288B2Substrate solution for back gate controlled SRAM with coexisting logic devicesIBM·Filed 2005·Granted Aug 26, 2008·13 cites·1 claims
- 3990US7365398B2Compact SRAMs and other multiple transistor structuresCORNELL RES FOUNDATION INC·Filed 2005·Granted Apr 29, 2008·16 cites·22 claims
- 4090US2025321910A1High performance interconnectINTEL CORP·Filed 2025·Application pending·0 cites
- 4189US11587890B2Tamper-resistant circuit, back-end of the line memory and physical unclonable function for supply chain protectionIBM·Filed 2020·Granted Feb 21, 2023·2 cites·20 claims
- 4289US10496309B2Input/output (I/O) loopback function for I/O signaling testingINTEL CORP·Filed 2017·Granted Dec 3, 2019·5 cites·22 claims
- 4389US9378171B2High performance interconnect physical layerINTEL CORP·Filed 2013·Granted Jun 28, 2016·6 cites·26 claims
- 4489US6665731B1Method for remotely accessing component management informationINTEL CORP·Filed 2000·Granted Dec 16, 2003·92 cites·19 claims
- 4589US6248626B1Floating back gate electrically erasable programmable read-only memory (EEPROM)IBM·Filed 1998·Granted Jun 19, 2001·72 cites·12 claims
- 4688US12367943B2Reference voltage adjustment per path for high speed memory signalingINTEL CORP·Filed 2021·Granted Jul 22, 2025·2 cites·24 claims
- 4788US8386823B2Method and apparatus for cost and power efficient, scalable operating system independent servicesINTEL CORP·Filed 2012·Granted Feb 26, 2013·7 cites·20 claims
- 4887US10580738B2Direct bonded heterogeneous integration packaging structuresIBM·Filed 2018·Granted Mar 3, 2020·4 cites·15 claims
- 4987US10256935B1Adaptive flexible grid in an optical networkFUJITSU LTD·Filed 2018·Granted Apr 9, 2019·6 cites·20 claims
- 5087US10049942B2Asymmetric semiconductor device and method of forming sameGLOBALFOUNDRIES INC·Filed 2015·Granted Aug 14, 2018·5 cites·11 claims
Showing the top 50 of 292 patent records by PatentIndex Score.
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