Inventor · disambiguated record
Shunhua T. Chang
Also filed as: CHANG SHUNHUA · CHANG SHUNHUA T · CHANG SHUNHUA THOMAS
22 granted patents·2 pending applications·105 citations·filing 2006–2018
94Inventor score
Top patents by PatentIndex Score
24 records- 0190US8169760B2Signal and power supply integrated ESD protection deviceCHANG SHUNHUA T·Filed 2009·Granted May 1, 2012·22 cites·27 claims
- 0289US10636872B1Apparatus and method to prevent integrated circuit from entering latch-up modeGLOBALFOUNDRIES INC·Filed 2018·Granted Apr 28, 2020·4 cites·20 claims
- 0386US8299533B2Vertical NPNP structure in a triple well CMOS processCAMPI JR JOHN B·Filed 2010·Granted Oct 30, 2012·8 cites·24 claims
- 0485US8803276B2Electrostatic discharge (ESD) device and method of fabricatingIBM·Filed 2013·Granted Aug 12, 2014·6 cites·13 claims
- 0585US8760827B2Robust ESD protection circuit, method and design structure for tolerant and failsafe designsCAMPI JR JOHN B·Filed 2009·Granted Jun 24, 2014·12 cites·25 claims
- 0684US9869708B2Integrated circuit protection during high-current ESD testingIBM·Filed 2015·Granted Jan 16, 2018·3 cites·7 claims
- 0783US9377496B2Cancellation of secondary reverse reflections in a very-fast transmission line pulse systemIBM·Filed 2015·Granted Jun 28, 2016·2 cites·14 claims
- 0881US8354722B2SCR/MOS clamp for ESD protection of integrated circuitsIBM·Filed 2011·Granted Jan 15, 2013·6 cites·23 claims
- 0981US8350329B2Low trigger voltage electrostatic discharge NFET in triple well CMOS technologyIBM·Filed 2010·Granted Jan 8, 2013·6 cites·16 claims
- 1080US8730624B2Electrostatic discharge power clamp with a JFET based RC trigger circuitCHANG SHUNHUA T·Filed 2011·Granted May 20, 2014·5 cites·12 claims
- 1180US8597993B2Electrostatic discharge (ESD) device and method of fabricatingCHANG SHUNHUA·Filed 2008·Granted Dec 3, 2013·8 cites·13 claims
- 1279US8796731B2Low leakage, low capacitance electrostatic discharge (ESD) silicon controlled recitifer (SCR), methods of manufacture and design structureABOU-KHALIL MICHEL J·Filed 2010·Granted Aug 5, 2014·5 cites·23 claims
- 1378US8513738B2ESD field-effect transistor and integrated diffusion resistorCAMPI JR JOHN B·Filed 2011·Granted Aug 20, 2013·5 cites·26 claims
- 1474US9274155B2Cancellation of secondary reverse reflections in a very-fast transmission line pulse systemIBM·Filed 2012·Granted Mar 1, 2016·2 cites·18 claims
- 1573US7648869B2Method of fabricating semiconductor structures for latch-up suppressionIBM·Filed 2006·Granted Jan 19, 2010·5 cites·12 claims
- 1669US9684029B2Transmission line pulse and very fast transmission line pulse reflection controlIBM·Filed 2014·Granted Jun 20, 2017·2 cites·20 claims
- 1767US8614489B2Vertical NPNP structure in a triple well CMOS processCAMPI JOHN B·Filed 2012·Granted Dec 24, 2013·2 cites·19 claims
- 1863US10359461B2Integrated circuit protection during high-current ESD testingIBM·Filed 2017·Granted Jul 23, 2019·0 cites·12 claims
- 1961US9435841B2Integrated circuit protection during high-current ESD testingCHANG SHUNHUA·Filed 2012·Granted Sep 6, 2016·1 cites·12 claims
- 2060US8634172B2Silicon controlled rectifier based electrostatic discharge protection circuit with integrated JFETs, method of operation and design structureCAMPI JR JOHN B·Filed 2010·Granted Jan 21, 2014·1 cites·22 claims
- 2151US8363367B2Electrical overstress protection circuitIBM·Filed 2009·Granted Jan 29, 2013·0 cites·21 claims
- 2249US2008116529A1Shallow trench isolation structure for shielding trapped charge in a semiconductor deviceCANNON ETHAN H·Filed 2008·Application pending·0 cites
- 2348US7385275B2Shallow trench isolation method for shielding trapped charge in a semiconductor deviceIBM·Filed 2006·Granted Jun 10, 2008·0 cites·13 claims
- 2439US2007297105A1Active ESD ProtectionBRENNAN CIARAN J·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →