Inventor · disambiguated record
John J. Cassels
Also filed as: CASSELS JOHN · CASSELS JOHN J
3 granted patents·2 pending applications·2 citations·filing 2005–2018
50Inventor score
Top patents by PatentIndex Score
5 records- 0146US7543198B2Test data reporting and analyzing using data array and related data analysisIBM·Filed 2005·Granted Jun 2, 2009·2 cites·9 claims
- 0241US10705121B2Probe card continuity testing and cleaning fixture comprising highly purified tungstenGLOBALFOUNDRIES INC·Filed 2018·Granted Jul 7, 2020·0 cites·13 claims
- 0339US7668683B2Numerical test data reporting in an image file and subsequent analysisIBM·Filed 2007·Granted Feb 23, 2010·0 cites·15 claims
- 0431US2009129185A1Semiconductor circuits capable of self detecting defectsCASSELS JOHN J·Filed 2007·Application pending·0 cites
- 0524US2012139574A1Vertical probe tip rotational scrub and methodCASSELS JOHN J·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →