Inventor · disambiguated record
Jerry Mcbride
Also filed as: MCBRIDE JERRY · MCBRIDE JERRY D
7 granted patents·4 pending applications·127 citations·filing 1999–2006
87Inventor score
Top patents by PatentIndex Score
11 records- 0188US6829737B1Method and system for storing device test information on a semiconductor device using on-device logic for determination of test resultsMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 7, 2004·36 cites·47 claims
- 0287US6530045B1Apparatus and method for testing rambus DRAMsMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 4, 2003·54 cites·28 claims
- 0380US7459923B2Probe interposers and methods of fabricating probe interposersMICRON TECHNOLOGY INC·Filed 2006·Granted Dec 2, 2008·11 cites·24 claims
- 0461US6854079B1Apparatus and method for reducing test resources in testing Rambus DRAMsMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 8, 2005·8 cites·25 claims
- 0557US7168018B2Apparatus and method for reducing test resources in testing DRAMsMICRON TECHNOLOGY INC·Filed 2004·Granted Jan 23, 2007·6 cites·48 claims
- 0656US7194667B2System for storing device test information on a semiconductor device using on-device logic for determination of test resultsMICRON TECHNOLOGY INC·Filed 2004·Granted Mar 20, 2007·7 cites·15 claims
- 0754US6986084B2Apparatus and method for reducing test resources in testing DRAMSMICRON TECHNOLOGY INC·Filed 2004·Granted Jan 10, 2006·5 cites·18 claims
- 0839US2007168790A1Apparatus and method for reducing test resources in testing dramsCOOPER CHRIS·Filed 2006·Application pending·0 cites
- 0938US2007245552A1Probe interposers and methods of fabricating probe interposersCALDWELL JOHN·Filed 2006·Application pending·0 cites
- 1038US2005262405A1Apparatus and method for reducing test resources in testing DRAMsCOOPER CHRIS·Filed 2005·Application pending·0 cites
- 1136US2006156136A1System for storing device test information on a semiconductor device using on-device logic for determination of test resultsMCBRIDE JERRY D·Filed 2006·Application pending·0 cites
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