System for storing device test information on a semiconductor device using on-device logic for determination of test results

Abstract

A system for testing a semiconductor device and storing device test results in nonvolatile memory elements on the tested device, in which the semiconductor device includes logic circuitry which allows test results to be determined on the device. Test results are stored temporarily in one or more latch elements on the semiconductor device and are subsequently stored in nonvolatile memory elements. The invention eliminates the need for device testing equipment to perform a determination of test results and thus may simplify the design of test equipment. In one embodiment of the invention, passing test results are stored in a mixed code of set and unset nonvolatile memory elements such that the test results contain information about correct application of test signals as well as correct functioning of the semiconductor device.

1 . An integrated circuit comprising: 
 a location configured to receive a test signal and provide the test signal to an input of a logic function; and    comparator circuitry coupled to both an output of the logic function and an expected signal and configured to set a state in a nonvolatile memory element in response to the output and the expected signal.    
   
   
       2 . The integrated circuit of  claim 1 , wherein the nonvolatile memory element comprises a fuse.  
   
   
       3 . The integrated circuit of  claim 1 , wherein the nonvolatile memory element comprises an antifuse.  
   
   
       4 . The integrated circuit of  claim 1 , wherein the nonvolatile memory element comprises a FLASH memory cell.  
   
   
       5 . The integrated circuit of  claim 1 , wherein the integrated circuit is a memory device.  
   
   
       6 . The integrated circuit of  claim 5 , wherein the memory device is selected from a group consisting of a DRAM, a SRAM, a VRAM and a FLASH memory.  
   
   
       7 . The integrated circuit of  claim 1 , wherein the integrated circuit is a microprocessor.  
   
   
       8 . The integrated circuit of  claim 1 , wherein the integrated circuit is a microcontroller.  
   
   
       9 . The integrated circuit of  claim 1 , wherein the integrated circuit is a memory controller.  
   
   
       10 . The integrated circuit of  claim 1 , wherein the integrated circuit is an application specific integrated circuit (ASIC).  
   
   
       11 . A memory device comprising: 
 at least one memory location, the at least one memory location configured to receive a test signal and provide the test signal to an input of a logic function; and    comparator circuitry coupled to both an output of the logic function and an expected signal and configured to set a state in a nonvolatile memory element in response to the output and the expected signal.    
   
   
       12 . The memory device of  claim 11 , wherein the nonvolatile memory element is a fuse.  
   
   
       13 . The memory device of  claim 11 , wherein the nonvolatile memory element is an antifuse.  
   
   
       14 . The memory device of  claim 11 , wherein the nonvolatile memory element is a FLASH memory cell.  
   
   
       15 . An electronic system comprising: 
 at least one processor;    at least one input device;    at least one output device;    at least one storage device;    a test circuit incorporated into at least one device of the at least one processor, the at least one input device, the at least one output device, and the at least one storage device, the test circuit comprising:    a location configured to receive a test signal and provide the test signal to an input of a logic function; and    comparator circuitry coupled to both an output of the logic function and an expected signal and configured to set a state in a nonvolatile memory element in response to the output and the expected signal.