Inventor · disambiguated record
Chang-Huhn Lee
Also filed as: LEE CHANG-HUHN
7 granted patents·1 pending application·14 citations·filing 2003–2009
79Inventor score
Technology areasH10P
Files withSAMSUNG ELECTRONICS CO LTD8
Top patents by PatentIndex Score
8 records- 0177US7473954B2Bitline of semiconductor device having stud type capping layer and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 6, 2009·5 cites·7 claims
- 0269US7566924B2Semiconductor device with gate spacer of positive slope and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jul 28, 2009·3 cites·9 claims
- 0366US8009895B2Semiconductor wafer analysis systemSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Aug 30, 2011·3 cites·20 claims
- 0455US7923323B2Metal capacitor including lower metal electrode having hemispherical metal grainsSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Apr 12, 2011·0 cites·14 claims
- 0547US2007178654A1Metal capacitor including lower metal electrode having hemispherical metal grainsSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 0646US7217618B2Semiconductor device and method for fabricating the same using damascene processSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 15, 2007·2 cites·23 claims
- 0745US6969673B2Semiconductor device with gate space of positive slope and fabrication method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 29, 2005·1 cites·10 claims
- 0841US6982199B2Bitline of semiconductor device having stud type capping layer and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jan 3, 2006·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →