Inventor · disambiguated record
Thomas S. Barnett
Also filed as: BARNETT THOMAS · BARNETT THOMAS S
9 granted patents·3 pending applications·141 citations·filing 1979–2009
88Inventor score
Files withIBM5UNIV AUBURN2BARNETT THOMAS S1FINDLAY PRODUCTS DIVISION OF REXCORP MAN LTD1NEWELL OPERATING CO1
Top patents by PatentIndex Score
12 records- 0186US6789032B2Method of statistical binning for reliability selectionIBM·Filed 2002·Granted Sep 7, 2004·63 cites·11 claims
- 0285US7917451B2Methods, apparatus, and program products to optimize semiconductor product yield prediction for performance and leakage screensIBM·Filed 2008·Granted Mar 29, 2011·10 cites·20 claims
- 0379US7409306B2System and method for estimating reliability of components for testing and quality optimizationUNIV AUBURN·Filed 2007·Granted Aug 5, 2008·6 cites·18 claims
- 0479US7194366B2System and method for estimating reliability of components for testing and quality optimizationUNIV AUBURN·Filed 2002·Granted Mar 20, 2007·21 cites·20 claims
- 0577US7416193B1Carpenter saw transporter assemblyBARNETT THOMAS S·Filed 2007·Granted Aug 26, 2008·17 cites·9 claims
- 0666US7139944B2Method and system for determining minimum post production test time required on an integrated circuit device to achieve optimum reliabilityIBM·Filed 2003·Granted Nov 21, 2006·15 cites·21 claims
- 0751USD263164SStoveFINDLAY PRODUCTS DIVISION OF REXCORP MAN LTD·Filed 1979·Granted Feb 23, 1982·4 cites·1 claims
- 0850US2008281541A1System and method for estimating reliability of components for testing and quality optimizationSINGH ADIT D·Filed 2008·Application pending·0 cites
- 0949US2009112352A1Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2009·Application pending·0 cites
- 1048US6721995B2HingeNEWELL OPERATING CO·Filed 2001·Granted Apr 20, 2004·5 cites·4 claims
- 1144US7477961B2Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2006·Granted Jan 13, 2009·0 cites·4 claims
- 1239US2003151422A1Method for burn-in testingFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →