System and method for estimating reliability of components for testing and quality optimization

Abstract

A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.

1 - 46 . (canceled) 
   
   
       47 . A method for optimizing post production testing on an integrated circuit device to achieve optimum reliability of the integrated circuit device, the method comprising:
 detecting defects, defective cells or active elements containing defective cells within the integrated circuit device;   counting a number of the defects, defective cells or active elements containing defective cells; and   determining a minimum amount of post production testing required on the integrated circuit device to achieve a pre-determined measure of reliability of the integrated circuit device, the determining based upon the number of defects, defective cells or active elements containing defective cells compared against one or more preset, normalized numbers.   
   
   
       48 . The method of  claim 47  wherein post production testing is stress testing. 
   
   
       49 . The method of  claim 47  wherein active elements are memory modules. 
   
   
       50 . The method of  claim 47  wherein the integrated circuit device comprises one or more activatable redundant elements, the method further comprising activating redundant elements to replace the defective cells or active elements containing defective cells. 
   
   
       51 . The method of  claim 47 , wherein the determining comprises:
 comparing the number against a first of the one or more preset normalized numbers; and   when the number is less than the first preset normalized number, assigning a minimum amount of post production testing associated with the first preset normalized number.   
   
   
       52 . The method of  claim 51 , wherein when there are multiple preset normalized numbers, each corresponding to an associated minimum amount of post production testing, the method further comprises:
 determining a lowest preset normalized number below which the number falls; and   assigning the minimum amount of post production testing associated with the lowest preset normalized number below which the number falls.