Inventor · disambiguated record
Kota Hara
Also filed as: FUJIOKA SHINYA · HARA KOTA
22 granted patents·2 pending applications·448 citations·filing 2000–2021
95Inventor score
Top patents by PatentIndex Score
24 records- 0198US7531485B2Method of producing a lubricant for a magnetic disk, lubricant for a magnetic disk, magnetic disk, and method of producing a magnetic diskHOYA CORP·Filed 2005·Granted May 12, 2009·71 cites·12 claims
- 0297US7277254B2Magnetic recording disk and process for manufacture thereofHOYA CORP·Filed 2005·Granted Oct 2, 2007·74 cites·4 claims
- 0396US7252897B2Magnetic recording disk and process for manufacture thereofHOYA CORP·Filed 2003·Granted Aug 7, 2007·82 cites·6 claims
- 0487US6754126B2Semiconductor memoryFUJITSU LTD·Filed 2002·Granted Jun 22, 2004·47 cites·56 claims
- 0585US10210418B2Object detection system and object detection methodMITSUBISHI ELECTRIC RES LABORATORIES INC·Filed 2016·Granted Feb 19, 2019·6 cites·23 claims
- 0685US7032142B2Memory circuit having parity cell arrayFUJITSU LTD·Filed 2002·Granted Apr 18, 2006·40 cites·18 claims
- 0785US6318707B1Semiconductor integrated circuit deviceFUJITSU LTD·Filed 2000·Granted Nov 20, 2001·38 cites·5 claims
- 0882US6288585B1Semiconductor device using external power voltage for timing sensitive signalsFUJITSU LTD·Filed 2000·Granted Sep 11, 2001·32 cites·10 claims
- 0976US7254090B2Semiconductor memory deviceFUJITSU LTD·Filed 2006·Granted Aug 7, 2007·10 cites·5 claims
- 1066US2021406960A1Joint-based item recognitionEBAY INC·Filed 2021·Application pending·0 cites
- 1163US7697367B2Semiconductor memory device with reduced current consumptionFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Apr 13, 2010·5 cites·19 claims
- 1260US6621750B2Semiconductor memoryFUJITSU LTD·Filed 2002·Granted Sep 16, 2003·11 cites·13 claims
- 1360US6614712B2Semiconductor memory deviceFUJITSU LTD·Filed 2002·Granted Sep 2, 2003·9 cites·1 claims
- 1459US8107314B2Semiconductor storage device and method for producing semiconductor storage deviceHARA KOTA·Filed 2009·Granted Jan 31, 2012·3 cites·15 claims
- 1558US6731553B2Memory circuit having compressed testing functionFUJITSU LTD·Filed 2002·Granted May 4, 2004·10 cites·12 claims
- 1651US7672181B2Semiconductor memory, test method of semiconductor memory and systemFUJITSU MICROELECTRONICS LTD·Filed 2008·Granted Mar 2, 2010·2 cites·13 claims
- 1748US11120478B2Joint-based item recognitionEBAY INC·Filed 2015·Granted Sep 14, 2021·0 cites·20 claims
- 1847US8139438B2Semiconductor storage device and memory systemHARA KOTA·Filed 2009·Granted Mar 20, 2012·1 cites·15 claims
- 1945US7180822B2Semiconductor memory device without decreasing performance thereof even if refresh operation or word line changing operation occur during burst operationFUJITSU LTD·Filed 2004·Granted Feb 20, 2007·4 cites·19 claims
- 2045US6529439B2Semiconductor memory deviceFUJITSU LTD·Filed 2001·Granted Mar 4, 2003·3 cites·6 claims
- 2142US8274854B2Semiconductor storage device and method for producing semiconductor storage deviceHARA KOTA·Filed 2011·Granted Sep 25, 2012·0 cites·4 claims
- 2241US8724425B2Semiconductor storage device and memory systemHARA KOTA·Filed 2012·Granted May 13, 2014·0 cites·4 claims
- 2336US8098531B2Semiconductor memory deviceHARA KOTA·Filed 2007·Granted Jan 17, 2012·0 cites·15 claims
- 2432US2002050847A1Semiconductor device with dummy interface circuitFiled 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →