Inventor · disambiguated record
Abner Bello
Also filed as: BELLO ABNER · BELLO ABNER F
13 granted patents·3 pending applications·74 citations·filing 2010–2019
89Inventor score
Top patents by PatentIndex Score
16 records- 0196US8889500B1Methods of forming stressed fin channel structures for FinFET semiconductor devicesGLOBALFOUNDRIES INC·Filed 2013·Granted Nov 18, 2014·28 cites·22 claims
- 0292US9318388B2Methods of forming substantially self-aligned isolation regions on FinFET semiconductor devices and the resulting devicesGLOBALFOUNDRIES INC·Filed 2015·Granted Apr 19, 2016·9 cites·18 claims
- 0390US9093302B2Methods of forming substantially self-aligned isolation regions on FinFET semiconductor devices and the resulting devicesGLOBALFOUNDRIES INC·Filed 2013·Granted Jul 28, 2015·10 cites·14 claims
- 0490US8975142B2FinFET channel stress using tungsten contacts in raised epitaxial source and drainGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 10, 2015·14 cites·16 claims
- 0586US9419137B1Stress memorization film and oxide isolation in finsGLOBALFOUNDRIES INC·Filed 2015·Granted Aug 16, 2016·7 cites·15 claims
- 0672US10343253B2Methods and systems for chemical mechanical planarization endpoint detection using an alternating current reference signalGLOBALFOUNDRIES INC·Filed 2014·Granted Jul 9, 2019·2 cites·8 claims
- 0771US8975094B2Test structure and method to facilitate development/optimization of process parametersGLOBALFOUNDRIES INC·Filed 2013·Granted Mar 10, 2015·3 cites·5 claims
- 0869US9911634B2Self-contained metrology wafer carrier systemsGLOBALFOUNDRIES INC·Filed 2016·Granted Mar 6, 2018·1 cites·20 claims
- 0959US10818528B2Self-contained metrology wafer carrier systemsGLOBALFOUNDRIES INC·Filed 2019·Granted Oct 27, 2020·0 cites·18 claims
- 1056US10242895B2Self-contained metrology wafer carrier systemsGLOBALFOUNDRIES INC·Filed 2018·Granted Mar 26, 2019·0 cites·19 claims
- 1150US2016190306A1Finfet device with a substantially self-aligned isolation region positioned under the channel regionGLOBALFOUNDRIES INC·Filed 2016·Application pending·0 cites
- 1245US9281249B2Decoupling measurement of layer thicknesses of a plurality of layers of a circuit structureGLOBALFOUNDRIES INC·Filed 2014·Granted Mar 8, 2016·0 cites·22 claims
- 1344US9117930B2Methods of forming stressed fin channel structures for FinFET semiconductor devicesGLOBALFOUNDRIES INC·Filed 2013·Granted Aug 25, 2015·0 cites·25 claims
- 1441US10931143B2Rechargeable wafer carrier systemsGLOBALFOUNDRIES INC·Filed 2016·Granted Feb 23, 2021·0 cites·14 claims
- 1539US2014017903A1Methods for fabricating integrated circuits with stressed semiconductor materialBELLO ABNER·Filed 2012·Application pending·0 cites
- 1635US2012144642A1Generating and Detecting Acoustic Resonance in Thin FilmsSTEINKRAUS ROBERT·Filed 2010·Application pending·0 cites
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