Inventor · disambiguated record
Tuan Truong
Also filed as: TRUONG TUAN · TRUONG TUAN MINH
6 granted patents·4 pending applications·83 citations·filing 2001–2023
81Inventor score
Files withEKC TECHNOLOGY INC2FORM ENERGY INC2ASM NUTOOL INC1DANANOMATERIALS LLC1FARASIS ENERGY GANZHOU CO LTD1
Top patents by PatentIndex Score
10 records- 0191US6857947B2Advanced chemical mechanical polishing system with smart endpoint detectionASM NUTOOL INC·Filed 2003·Granted Feb 22, 2005·43 cites·49 claims
- 0279US6638326B2Compositions for chemical mechanical planarization of tantalum and tantalum nitrideEKC TECHNOLOGY INC·Filed 2001·Granted Oct 28, 2003·22 cites·10 claims
- 0378US11592485B2Methods and apparatus for contactor weld detection in a vehicleFARASIS ENERGY GANZHOU CO LTD·Filed 2020·Granted Feb 28, 2023·2 cites·19 claims
- 0471US6866792B2Compositions for chemical mechanical planarization of copperEKC TECHNOLOGY INC·Filed 2001·Granted Mar 15, 2005·15 cites·45 claims
- 0565US2024072379A1Construction of battery module and systems interfaces for metal-air batteriesFORM ENERGY INC·Filed 2023·Application pending·0 cites
- 0654US2024072312A1Battery Management System Control CircuitryFORM ENERGY INC·Filed 2023·Application pending·0 cites
- 0752US10218182B2Photovoltaic systems with voltage limiting devicesSUNPOWER CORP·Filed 2016·Granted Feb 26, 2019·0 cites·19 claims
- 0838US7033409B2Compositions for chemical mechanical planarization of tantalum and tantalum nitrideDANANOMATERIALS LLC·Filed 2003·Granted Apr 25, 2006·1 cites·20 claims
- 0937US2004023607A1Method and apparatus for integrated chemical mechanical polishing of copper and barrier layersFiled 2003·Application pending·0 cites
- 1036US2004014399A1Selective barrier removal slurryFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →