Inventor · disambiguated record
Shubneesh Batra
Also filed as: BATRA SHUBNEESH
86 granted patents·5 pending applications·2,240 citations·filing 1993–2020
99Inventor score
Files withMICRON TECHNOLOGY INC86MICRON SEMICONDUCTOR INC2APPLIED MATERIALS INC1BATRA SHUBNEESH1MICRON TEHNOLOGY INC1
Top patents by PatentIndex Score
91 records- 0199US6301164B1Antifuse method to repair columns in a prefetched output memory architectureMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 9, 2001·458 cites·30 claims
- 0297US7005697B2Method of forming a non-volatile electron storage memory and the resulting deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 28, 2006·136 cites·38 claims
- 0395US6490220B1Method for reliably shutting off oscillator pulses to a charge-pumpMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 3, 2002·103 cites·31 claims
- 0493US5742555AMethod of anti-fuse repairMICRON TECHNOLOGY INC·Filed 1996·Granted Apr 21, 1998·105 cites·22 claims
- 0591US6417085B1Methods of forming a field effect transistor gate constructionMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 9, 2002·53 cites·50 claims
- 0691US5770500AProcess for improving roughness of conductive layerMICRON TECHNOLOGY INC·Filed 1996·Granted Jun 23, 1998·107 cites·33 claims
- 0789US6233190B1Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuitMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·57 cites·41 claims
- 0888US5744846ASRAM cell employing substantially vertically elongated pull-up resistors and methods of making, and resistor constructions and methods of makingMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 28, 1998·47 cites·25 claims
- 0987US6515931B2Method of anti-fuse repairMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 4, 2003·34 cites·32 claims
- 1086US6778453B2Method of storing a temperature threshold in an integrated circuit, method of modifying operation of dynamic random access memory in response to temperature, programmable temperature sensing circuit and memory integrated circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·32 cites·54 claims
- 1185US6552945B2Method for storing a temperature threshold in an integrated circuit, method for storing a temperature threshold in a dynamic random access memory, method of modifying dynamic random access memory operation in response to temperature, programmable temperature sensing circuit and memory integrated circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 22, 2003·30 cites·32 claims
- 1285US5385854AMethod of forming a self-aligned low density drain inverted thin film transistorMICRON SEMICONDUCTOR INC·Filed 1993·Granted Jan 31, 1995·61 cites·26 claims
- 1384US7452760B2Thin film transistors and semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 18, 2008·5 cites·6 claims
- 1484US5789317ALow temperature reflow method for filling high aspect ratio contactsMICRON TECHNOLOGY INC·Filed 1996·Granted Aug 4, 1998·55 cites·28 claims
- 1583US7939394B2Multiple-depth STI trenches in integrated circuit fabricationMICRON TECHNOLOGY INC·Filed 2008·Granted May 10, 2011·9 cites·21 claims
- 1683US7354812B2Multiple-depth STI trenches in integrated circuit fabricationMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 8, 2008·29 cites·13 claims
- 1783US6233194B1Method of anti-fuse repairMICRON TECHNOLOGY INC·Filed 2000·Granted May 15, 2001·23 cites·47 claims
- 1880US6577010B2Stepped photoresist profile and opening formed using the profileMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 10, 2003·18 cites·10 claims
- 1980US5998276AMethods of making a SRAM cell employing substantially vertically elongated pull-up resistors and methods of making resistor constructionsMICRON TEHNOLOGY INC·Filed 1997·Granted Dec 7, 1999·29 cites·6 claims
- 2080US5683930ASRAM cell employing substantially vertically elongated pull-up resistors and methods of making, and resistor constructions and methods of makingMICRON TECHNOLOGY INC·Filed 1995·Granted Nov 4, 1997·29 cites·29 claims
- 2179US6890842B2Method of forming a thin film transistorMICRON TECHNOLOGY INC·Filed 2001·Granted May 10, 2005·13 cites·8 claims
- 2279US6600191B2Method of fabricating conductive straps to interconnect contacts to corresponding digit lines by employing an angled sidewall implant and semiconductor devices fabricated therebyMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 29, 2003·20 cites·29 claims
- 2378US7566907B2Thin film transistors and semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2008·Granted Jul 28, 2009·3 cites·8 claims
- 2478US6344376B2Method of forming a thin film transistorMICRON TECHNOLOGY INC·Filed 2001·Granted Feb 5, 2002·12 cites·8 claims
- 2578US6060355AProcess for improving roughness of conductive layerMICRON TECHNOLOGY INC·Filed 1998·Granted May 9, 2000·44 cites·32 claims
- 2678US5541137AMethod of forming improved contacts from polysilicon to silicon or other polysilicon layersMICRON SEMICONDUCTOR INC·Filed 1994·Granted Jul 30, 1996·35 cites·23 claims
- 2777US6836000B1Antifuse structure and method of useMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 28, 2004·20 cites·38 claims
- 2877US6114735AField effect transistors and method of forming field effect transistorsMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 5, 2000·34 cites·27 claims
- 2976US7160795B2Method and structures for reduced parasitic capacitance in integrated circuit metallizationsMICRON TECHNOLOGY INC·Filed 2002·Granted Jan 9, 2007·20 cites·21 claims
- 3076US5665611AMethod of forming a thin film transistor using fluorine passivationMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 9, 1997·20 cites·29 claims
- 3176US5548132AThin film transistor with large grain size DRW offset region and small grain size source and drain and channel regionsMICRON TECHNOLOGY INC·Filed 1995·Granted Aug 20, 1996·32 cites·6 claims
- 3275US5978248AMethod of anti-fuse repairMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 2, 1999·32 cites·17 claims
- 3374US6001675AMethod of forming a thin film transistorMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 14, 1999·17 cites·11 claims
- 3473US7825414B2Method of forming a thin film transistorMICRON TECHNOLOGY INC·Filed 2008·Granted Nov 2, 2010·2 cites·9 claims
- 3573US5939760ASRAM cell employing substantially vertically elongated pull-up resistors and methods of making, and resistor constructions and methods of makingMICRON TECHNOLOGY INC·Filed 1998·Granted Aug 17, 1999·19 cites·22 claims
- 3672US7385222B2Thin film transistors and semiconductor constructionsMICRON TECHNOLOGY INC·Filed 2004·Granted Jun 10, 2008·8 cites·9 claims
- 3772US6909196B2Method and structures for reduced parasitic capacitance in integrated circuit metallizationsMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 21, 2005·16 cites·14 claims
- 3872US5977560AThin film transistor constructions with polycrystalline silicon-germanium alloy doped with carbon in the channel regionMICRON TECHNOLOGY INC·Filed 1997·Granted Nov 2, 1999·29 cites·8 claims
- 3970US6238957B1Method of forming a thin film transistorMICRON TECHNOLOGY INC·Filed 1999·Granted May 29, 2001·14 cites·4 claims
- 4069US6127242AMethod for semiconductor device isolation using oxygen and nitrogen ion implantations to reduce lateral encroachmentMICRON TECHNOLOGY INC·Filed 1994·Granted Oct 3, 2000·48 cites·17 claims
- 4167US6329686B1Method of fabricating conductive straps to interconnect contacts to corresponding digit lines by employing an angled sidewall implant and semiconductor devices fabricated therebyMICRON TECHNOLOGY INC·Filed 1999·Granted Dec 11, 2001·25 cites·58 claims
- 4266US8541821B2Method of forming a non-volatile electron storage memory and the resulting deviceBATRA SHUBNEESH·Filed 2011·Granted Sep 24, 2013·2 cites·17 claims
- 4366US7259464B1Vertical twist scheme for high-density DRAMsMICRON TECHNOLOGY INC·Filed 2000·Granted Aug 21, 2007·11 cites·30 claims
- 4466US6903014B2Low temperature reflow method for filling high aspect ratio contactsMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 7, 2005·9 cites·29 claims
- 4562US7041547B2Methods of forming polished material and methods of forming isolation regionsMICRON TECHNOLOGY INC·Filed 2005·Granted May 9, 2006·1 cites·24 claims
- 4662US6320202B1Bottom-gated thin film transistors comprising germanium in a channel regionMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 20, 2001·19 cites·7 claims
- 4761US6833752B2High output high efficiency low voltage charge pumpMICRON TECHNOLOGY INC·Filed 2001·Granted Dec 21, 2004·16 cites·46 claims
- 4861US6495468B2Laser ablative removal of photoresistMICRON TECHNOLOGY INC·Filed 2000·Granted Dec 17, 2002·9 cites·19 claims
- 4961US6242781B1Resistor constructionsMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 5, 2001·12 cites·20 claims
- 5061US6200906B1Stepped photoresist profile and opening formed using the profileMICRON TECHNOLOGY INC·Filed 1998·Granted Mar 13, 2001·19 cites·39 claims
Showing the top 50 of 91 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →