Inventor · disambiguated record
Jerzy Ruzyllo
Also filed as: RUZYLLO JERZY
10 granted patents·655 citations·filing 1992–2008
92Inventor score
Top patents by PatentIndex Score
10 records- 0197US5439553AControlled etching of oxides via gas phase reactionsPENN STATE RES FOUND·Filed 1994·Granted Aug 8, 1995·338 cites·12 claims
- 0294US5661408AReal-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 1995·Granted Aug 26, 1997·128 cites·39 claims
- 0388US8222061B2Mist fabrication of quantum dot devicesXU JIAN·Filed 2008·Granted Jul 17, 2012·18 cites·16 claims
- 0487US5234540AProcess for etching oxide films in a sealed photochemical reactorSUBMICRON SYSTEMS INC·Filed 1992·Granted Aug 10, 1993·105 cites·1 claims
- 0586US6315574B1Method for real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2000·Granted Nov 13, 2001·24 cites·18 claims
- 0672US6069017AMethod for real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 1997·Granted May 30, 2000·25 cites·2 claims
- 0765US6909302B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2001·Granted Jun 21, 2005·6 cites·5 claims
- 0856US6967490B1Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Nov 22, 2005·3 cites·16 claims
- 0953US6924657B2Real-time in-line testing of semiconductor wafersQC SOLUTIONS INC·Filed 2003·Granted Aug 2, 2005·2 cites·15 claims
- 1039USRE38760EControlled etching of oxides via gas phase reactionsPENN STATE RES FOUND·Filed 1997·Granted Jul 19, 2005·6 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →