Inventor · disambiguated record
Raul V. Tan
Also filed as: TAN RAUL V
4 granted patents·120 citations·filing 1987–2016
78Inventor score
Top patents by PatentIndex Score
4 records- 0191US9709386B1Apparatus and methods for measuring properties in a TSV structure using beam profile reflectometryKLA TENCOR CORP·Filed 2016·Granted Jul 18, 2017·10 cites·17 claims
- 0290US4890239ALithographic process analysis and control systemSHIPLEY CO·Filed 1987·Granted Dec 26, 1989·82 cites·12 claims
- 0361US4857738AAbsorption measurements of materialsGEN SIGNAL CORP·Filed 1987·Granted Aug 15, 1989·22 cites·19 claims
- 0440US4874240ACharacterization of semiconductor resist material during processingHOECHST CELANESE·Filed 1988·Granted Oct 17, 1989·6 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →