Inventor · disambiguated record
Holger Kohr
Also filed as: KOHR HOLGER
10 granted patents·7 pending applications·12 citations·filing 2019–2025
82Inventor score
Top patents by PatentIndex Score
17 records- 0196US11460419B2Electron diffraction holographyFEI CO·Filed 2020·Granted Oct 4, 2022·4 cites·20 claims
- 0295US11906450B2Electron diffraction holographyFEI CO·Filed 2022·Granted Feb 20, 2024·2 cites·20 claims
- 0387US12216068B2Bifocal electron microscopeFEI CO·Filed 2024·Granted Feb 4, 2025·0 cites·20 claims
- 0485US10937625B2Method of imaging a sample using an electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 0580US2025378543A1Area selection in charged particle microscope imagingFEI CO·Filed 2025·Application pending·0 cites
- 0679US10923308B1Method and system for energy resolved chroma imagingFEI CO·Filed 2019·Granted Feb 16, 2021·2 cites·19 claims
- 0774US2025155387A1Bifocal electron microscopeFEI CO·Filed 2025·Application pending·0 cites
- 0866US12347083B2Area selection in charged particle microscope imagingFEI CO·Filed 2021·Granted Jul 1, 2025·0 cites·21 claims
- 0965US11887809B2Auto-tuning stage settling time with feedback in charged particle microscopyFEI CO·Filed 2022·Granted Jan 30, 2024·0 cites·20 claims
- 1061US12327342B2Automatic particle beam focusingFEI CO·Filed 2022·Granted Jun 10, 2025·0 cites·19 claims
- 1160US2025321197A1Method for obtaining a tilt series of images of a sample at a plurality of tilt anglesFEI CO·Filed 2025·Application pending·0 cites
- 1259US12392735B2Sparse image reconstruction from neighboring tomography tilt imagesFEI CO·Filed 2021·Granted Aug 19, 2025·0 cites·21 claims
- 1357US11404241B2Simultaneous TEM and STEM microscopeFEI CO·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 1453US2024128050A1Method of automated data acquisition for a transmission electron microscopeFEI CO·Filed 2023·Application pending·0 cites
- 1552US2024071051A1Automated Selection And Model Training For Charged Particle Microscope ImagingFEI CO·Filed 2022·Application pending·0 cites
- 1651US2025238571A1Digital twin calibrationFEI ELECTRON OPTICS B V·Filed 2024·Application pending·0 cites
- 1745US2021305007A1Dual beam bifocal charged particle microscopeFEI CO·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →