Inventor · disambiguated record
Mark S. Styduhar
Also filed as: STYDUHAR MARK S · STYDUHAR MARK STEVEN
19 granted patents·1 pending application·238 citations·filing 1991–2013
94Inventor score
Top patents by PatentIndex Score
20 records- 0187US8839177B1Method and system allowing for semiconductor design rule optimizationIBM·Filed 2013·Granted Sep 16, 2014·13 cites·20 claims
- 0286US7459958B2Circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applicationsIBM·Filed 2006·Granted Dec 2, 2008·14 cites·5 claims
- 0386US5396636ARemote power control via data linkIBM·Filed 1991·Granted Mar 7, 1995·137 cites·11 claims
- 0479US7504847B2Mechanism for detection and compensation of NBTI induced threshold degradationIBM·Filed 2006·Granted Mar 17, 2009·12 cites·20 claims
- 0578US7696811B2Methods and circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applicationsIBM·Filed 2007·Granted Apr 13, 2010·9 cites·16 claims
- 0674US7849426B2Mechanism for detection and compensation of NBTI induced threshold degradationIBM·Filed 2007·Granted Dec 7, 2010·6 cites·13 claims
- 0770US8578314B1Circuit design with growable capacitor arraysBICKFORD JEANNE P·Filed 2012·Granted Nov 5, 2013·3 cites·11 claims
- 0870US7793163B2Method and system for extending the useful life of another systemIBM·Filed 2008·Granted Sep 7, 2010·4 cites·20 claims
- 0968US7821053B2Tunable capacitorIBM·Filed 2006·Granted Oct 26, 2010·4 cites·8 claims
- 1066US8799836B1Yield optimization for design library elements at library element level or at product levelIBM·Filed 2013·Granted Aug 5, 2014·2 cites·20 claims
- 1163US6549150B1Integrated test structure and method for verification of microelectronic devicesIBM·Filed 2001·Granted Apr 15, 2003·16 cites·22 claims
- 1262US7437620B2Method and system for extending the useful life of another systemIBM·Filed 2005·Granted Oct 14, 2008·2 cites·8 claims
- 1362US7049857B2Asymmetric comparator for low power applicationsIBM·Filed 2002·Granted May 23, 2006·10 cites·20 claims
- 1459US7671666B2Methods to reduce threshold voltage tolerance and skew in multi-threshold voltage applicationsIBM·Filed 2008·Granted Mar 2, 2010·1 cites·10 claims
- 1556US9070791B2Tunable capacitorBARROWS COREY K·Filed 2007·Granted Jun 30, 2015·2 cites·12 claims
- 1653US2008246533A1Methods and circuits to reduce threshold voltage tolerance and skew in multi-threshold voltage applicationsBARROWS COREY KENNETH·Filed 2008·Application pending·0 cites
- 1745US6894577B2Apparatus for providing power control to a real-time clock oscillatorIBM·Filed 2003·Granted May 17, 2005·3 cites·14 claims
- 1843US7091743B2Data acknowledgment using impedance mismatchingIBM·Filed 2003·Granted Aug 15, 2006·0 cites·18 claims
- 1940US7089132B2Method and system for providing quality control on wafers running on a manufacturing lineIBM·Filed 2004·Granted Aug 8, 2006·0 cites·13 claims
- 2039US8010813B2Structure for system for extending the useful life of another systemIBM·Filed 2008·Granted Aug 30, 2011·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →