Inventor · disambiguated record
Katsu Honna
Also filed as: HONNA KATSU
8 granted patents·2 pending applications·105 citations·filing 1992–2009
86Inventor score
Top patents by PatentIndex Score
10 records- 0171US5235201ASemiconductor device with input protection circuitTOSHIBA KK·Filed 1992·Granted Aug 10, 1993·36 cites·6 claims
- 0261US5955766ADiode with controlled breakdownTOSHIBA KK·Filed 1996·Granted Sep 21, 1999·26 cites·32 claims
- 0349US6031266ASemiconductor device with conductive sidewall filmTOSHIBA KK·Filed 1997·Granted Feb 29, 2000·13 cites·6 claims
- 0446US5719432ASemiconductor device including bipolar transistor with improved current concentration characteristicsTOSHIBA KK·Filed 1996·Granted Feb 17, 1998·13 cites·11 claims
- 0546US2009085128A1Semiconductor device and method for manufacturing sameTOSHIBA KK·Filed 2008·Application pending·0 cites
- 0642US7897996B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2009·Granted Mar 1, 2011·0 cites·20 claims
- 0739US2008206907A1Method for fabricating semiconductor device to which test is performed at wafer level and apparatus for testing semiconductor deviceSHISHIDO NORIHIKO·Filed 2007·Application pending·0 cites
- 0838US5525544ASemiconductor device with a MOS structure and a manufacturing method thereofTOSHIBA KK·Filed 1994·Granted Jun 11, 1996·10 cites·7 claims
- 0932US5723910ASemiconductor device having a MOS structureTOSHIBA KK·Filed 1996·Granted Mar 3, 1998·5 cites·9 claims
- 1023US6316324B1Method of manufacturing semiconductor device without forming selective region by lithographyTOSHIBA KK·Filed 1996·Granted Nov 13, 2001·2 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →