Assignee
SHISHIDO NORIHIKO
0 granted patents·2 pending applications·0 citations·filing 2007–2007
Top patents by PatentIndex Score
2 records- 0139US2008206907A1Method for fabricating semiconductor device to which test is performed at wafer level and apparatus for testing semiconductor deviceSHISHIDO NORIHIKO·Filed 2007·Application pending·0 cites
- 0236US2008093722A1Encapsulation type semiconductor device and manufacturing method thereofSHISHIDO NORIHIKO·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when SHISHIDO NORIHIKO files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Counts cover granted patents and pending applications in the PatentIndex corpus. How scoring works →