Inventor · disambiguated record
Luká{Hacek Over (S)} Hübner
Also filed as: HUBNER LUKÁ{HACEK OVER (S)} · HÜBNER LUKÁ{HACEK OVER (S)}
3 granted patents·1 pending application·2 citations·filing 2020–2022
51Inventor score
Files withFEI CO4
Top patents by PatentIndex Score
4 records- 0177US11282670B1Slice depth reconstruction of charged particle images using model simulation for improved generation of 3D sample imagesFEI CO·Filed 2020·Granted Mar 22, 2022·1 cites·20 claims
- 0269US11264200B1Lamella alignment based on a reconstructed volumeFEI CO·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 0348US2023093535A1Apparatus and method for automated grid validationFEI CO·Filed 2022·Application pending·0 cites
- 0445US11380529B2Depth reconstruction for 3D images of samples in a charged particle systemFEI CO·Filed 2020·Granted Jul 5, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →