Inventor · disambiguated record
Anthony Vacca
Also filed as: VACCA ANTHONY · VACCA ANTHONY A
6 granted patents·7 pending applications·350 citations·filing 1976–2009
88Inventor score
Top patents by PatentIndex Score
13 records- 0194US6076465ASystem and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 1997·Granted Jun 20, 2000·113 cites·25 claims
- 0290US4037270ACircuit packaging and coolingCONTROL DATA CORP·Filed 1976·Granted Jul 19, 1977·99 cites·11 claims
- 0383US5211565AHigh density interconnect apparatusCRAY RESEARCH INC·Filed 1992·Granted May 18, 1993·58 cites·14 claims
- 0481US5167511AHigh density interconnect apparatusCRAY RESEARCH INC·Filed 1990·Granted Dec 1, 1992·56 cites·26 claims
- 0569US6731787B1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2002·Granted May 4, 2004·9 cites·8 claims
- 0668US6381358B1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2000·Granted Apr 30, 2002·15 cites·25 claims
- 0757US2009324054A1System and method for determing reticle defect printabilityVACCA ANTHONY·Filed 2009·Application pending·0 cites
- 0854US2007140548A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2006·Application pending·0 cites
- 0954US2008133160A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2007·Application pending·0 cites
- 1043US2005140970A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2005·Application pending·0 cites
- 1141US2003138138A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2003·Application pending·0 cites
- 1240US2004096094A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2003·Application pending·0 cites
- 1338US2002126888A1System and method for determining reticle defect printabilityKLA TENCOR CORP·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →