Inventor · disambiguated record
Peilin Jiang
Also filed as: JIANG PEILIN
7 granted patents·3 pending applications·107 citations·filing 2012–2024
81Inventor score
Top patents by PatentIndex Score
10 records- 0194US9915522B1Optimized spatial modeling for optical CD metrologyJIANG PEILIN·Filed 2014·Granted Mar 13, 2018·94 cites·26 claims
- 0286US11067389B2Overlay metrology system and methodKLA TENCOR CORP·Filed 2018·Granted Jul 20, 2021·4 cites·29 claims
- 0375US9127927B2Techniques for optimized scatterometryILORETA JONATHAN·Filed 2012·Granted Sep 8, 2015·5 cites·40 claims
- 0475US8762100B1Numerical aperture integration for optical critical dimension (OCD) metrologyCHU HANYOU·Filed 2012·Granted Jun 24, 2014·2 cites·20 claims
- 0574US8670948B2Numerical aperture integration for optical critical dimension (OCD) metrologyCHU HANYOU·Filed 2012·Granted Mar 11, 2014·2 cites·21 claims
- 0661US12481813B2Test point insertion in analog circuit design testingSYNOPSYS INC·Filed 2023·Granted Nov 25, 2025·0 cites·20 claims
- 0761US2025238584A1Prediction-based termination of analog circuit simulationsSYNOPSYS INC·Filed 2024·Application pending·0 cites
- 0857US11669667B2Automatic test pattern generation (ATPG) for parametric faultsSYNOPSYS INC·Filed 2021·Granted Jun 6, 2023·0 cites·18 claims
- 0951US2016135383A1Manufacturing method for artificial plant and artificial plantJIANG PEILIN·Filed 2013·Application pending·0 cites
- 1051US2024193336A1Automatic test pattern generation to increase coverage in detecting defects in analog circuitsSYNOPSYS INC·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →