Inventor · disambiguated record
Thomas J. Hartswick
Also filed as: HARTSWICK THOMAS J · HARTSWICK THOMAS JOHN
17 granted patents·1 pending application·293 citations·filing 1990–2019
94Inventor score
Files withIBM18
Top patents by PatentIndex Score
18 records- 0189US5034348AProcess for forming refractory metal silicide layers of different thicknesses in an integrated circuitIBM·Filed 1990·Granted Jul 23, 1991·129 cites·24 claims
- 0288US9620371B2Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2015·Granted Apr 11, 2017·3 cites·12 claims
- 0380US5420455AArray fuse damage protection devices and fabrication methodIBM·Filed 1994·Granted May 30, 1995·49 cites·5 claims
- 0478US10177000B2Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2017·Granted Jan 8, 2019·1 cites·13 claims
- 0575US10438803B2Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2015·Granted Oct 8, 2019·1 cites·20 claims
- 0672US6627926B2Method of designing and structure for visual and electrical test of semiconductor devicesIBM·Filed 2001·Granted Sep 30, 2003·16 cites·2 claims
- 0768US5523253AArray protection devices and fabrication methodIBM·Filed 1995·Granted Jun 4, 1996·28 cites·2 claims
- 0867US2019362977A1Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2019·Application pending·0 cites
- 0963US9312140B2Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2014·Granted Apr 12, 2016·0 cites·12 claims
- 1062US9691623B2Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2016·Granted Jun 27, 2017·0 cites·14 claims
- 1161US9478427B2Semiconductor structures having low resistance paths throughout a waferIBM·Filed 2015·Granted Oct 25, 2016·0 cites·5 claims
- 1252US6274393B1Method for measuring submicron imagesIBM·Filed 1998·Granted Aug 14, 2001·17 cites·15 claims
- 1352US5808364AInterconnects using metal spacersIBM·Filed 1997·Granted Sep 15, 1998·15 cites·11 claims
- 1451US5723898AArray protection devices and methodIBM·Filed 1996·Granted Mar 3, 1998·14 cites·2 claims
- 1541US5907763AMethod and device to monitor integrated temperature in a heat cycle processIBM·Filed 1996·Granted May 25, 1999·8 cites·11 claims
- 1640US5926738AInterconnects using metal spacers and method for forming sameIBM·Filed 1998·Granted Jul 20, 1999·7 cites·13 claims
- 1738US10134670B2Wafer with plated wires and method of fabricating sameIBM·Filed 2015·Granted Nov 20, 2018·0 cites·10 claims
- 1836US6251773B1Method of designing and structure for visual and electrical test of semiconductor devicesIBM·Filed 1999·Granted Jun 26, 2001·5 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →