Inventor · disambiguated record
Kotaro Hosoya
Also filed as: HOSOYA KOTARO
8 granted patents·2 pending applications·32 citations·filing 2009–2022
82Inventor score
Technology areasH01J
Top patents by PatentIndex Score
10 records- 0179US10777379B1Holder and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 15, 2020·2 cites·14 claims
- 0269US9881769B2Charged particle beam device and charged particle beam device control methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 30, 2018·2 cites·16 claims
- 0369USD684274SSample holder for an electron microscopeHOSOYA KOTARO·Filed 2012·Granted Jun 11, 2013·19 cites·1 claims
- 0469US2022402000A1Charged Particle Beam Apparatus and Cleaning MethodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 0566US10937626B2Holder and charged particle beam apparatusHITACHI HIGH TECH CORP·Filed 2020·Granted Mar 2, 2021·0 cites·5 claims
- 0664US8044352B2Electron microscopyHITACHI HIGH TECH CORP·Filed 2009·Granted Oct 25, 2011·1 cites·8 claims
- 0755US11458513B2Charged particle beam apparatus and cleaning methodHITACHI HIGH TECH CORP·Filed 2017·Granted Oct 4, 2022·0 cites·12 claims
- 0853US9159530B2Electron microscope sample holder and sample observation methodHOSOYA KOTARO·Filed 2011·Granted Oct 13, 2015·1 cites·10 claims
- 0946USD679411SSample holder for an electron microscopeHOSOYA KOTARO·Filed 2012·Granted Apr 2, 2013·7 cites·1 claims
- 1046US2025037962A1Electronic Cleaning DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →