Inventor · disambiguated record
Jan Wilstrup
Also filed as: WILSTRUP JAN · WILSTRUP JAN B · WILSTRUP JAN BRIAN
13 granted patents·6 pending applications·374 citations·filing 1983–2005
94Inventor score
Files withWAVECREST CORP13GIGAMAX TECHNOLOGIES INC1HAMRE JOHN DAVID1MEGATEST CORP1MICRO COMPONENT TECHNOLOGY INC1
Top patents by PatentIndex Score
19 records- 0191US6356850B1Method and apparatus for jitter analysisWAVECREST CORP·Filed 1999·Granted Mar 12, 2002·82 cites·37 claims
- 0282US6449570B1Analysis of noise in repetitive waveformsWAVECREST CORP·Filed 2000·Granted Sep 10, 2002·24 cites·9 claims
- 0382US6185509B1Analysis of noise in repetitive waveformsWAVECREST CORP·Filed 1998·Granted Feb 6, 2001·46 cites·20 claims
- 0478US8054907B2Waveform analyzerHAMRE JOHN DAVID·Filed 2005·Granted Nov 8, 2011·4 cites·20 claims
- 0578US6298315B1Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 1998·Granted Oct 2, 2001·64 cites·17 claims
- 0678US4527126AAC parametric circuit having adjustable delay lock loopMICRO COMPONENT TECHNOLOGY INC·Filed 1983·Granted Jul 2, 1985·31 cites·16 claims
- 0777US5773990AIntegrated circuit test power supplyMEGATEST CORP·Filed 1995·Granted Jun 30, 1998·45 cites·8 claims
- 0876US6799144B2Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 2001·Granted Sep 28, 2004·18 cites·74 claims
- 0969US6194925B1Time interval measurement system incorporating a linear ramp generation circuitWAVECREST CORP·Filed 1998·Granted Feb 27, 2001·24 cites·17 claims
- 1066US7688927B2Method and apparatus for clock recoveryGIGAMAX TECHNOLOGIES INC·Filed 2005·Granted Mar 30, 2010·4 cites·6 claims
- 1166US6393088B1Measurement system with a frequency-dividing edge counterWAVECREST CORP·Filed 2001·Granted May 21, 2002·13 cites·15 claims
- 1265US7016805B2Method and apparatus for analyzing a distributionWAVECREST CORP·Filed 2001·Granted Mar 21, 2006·11 cites·129 claims
- 1357US6813589B2Method and apparatus for determining system response characteristicsWAVECREST CORP·Filed 2001·Granted Nov 2, 2004·8 cites·34 claims
- 1447US2005027477A1Method and apparatus for analyzing measurementsWAVECREST CORP·Filed 2004·Application pending·0 cites
- 1545US2004243889A1N-dimensional determination of bit-error ratesFiled 2004·Application pending·0 cites
- 1644US2002120420A1Method and apparatus for jitter analysisWAVECREST CORP·Filed 2001·Application pending·0 cites
- 1737US2003058970A1Method and apparatus for measuring a waveformFiled 2002·Application pending·0 cites
- 1835US2004001194A1Electromagnetic and optical analyzerWAVECREST CORP·Filed 2002·Application pending·0 cites
- 1935US2001028262A1Time interval measurement system incorporating a linear ramp generation circuitWAVECREST CORP·Filed 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →