Assignee
MEGATEST CORP
US·7 granted patents·321 citations·filing 1987–1995
Top patents by PatentIndex Score
7 records- 0185US5917331AIntegrated circuit test method and structureMEGATEST CORP·Filed 1995·Granted Jun 29, 1999·74 cites·9 claims
- 0284US4806852AAutomatic test system with enhanced performance of timing generatorsMEGATEST CORP·Filed 1987·Granted Feb 21, 1989·59 cites·13 claims
- 0381US5521493ASemiconductor test system including a novel driver/load circuitMEGATEST CORP·Filed 1994·Granted May 28, 1996·51 cites·6 claims
- 0479US4809221ATiming signal generatorMEGATEST CORP·Filed 1988·Granted Feb 28, 1989·41 cites·21 claims
- 0577US5773990AIntegrated circuit test power supplyMEGATEST CORP·Filed 1995·Granted Jun 30, 1998·45 cites·8 claims
- 0667US5606568AMethod and apparatus for performing serial and parallel scan testing on an integrated circuitMEGATEST CORP·Filed 1995·Granted Feb 25, 1997·38 cites·14 claims
- 0758US4779221ATiming signal generatorMEGATEST CORP·Filed 1987·Granted Oct 18, 1988·13 cites·11 claims
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