Inventor · disambiguated record
Frans Nijs
Also filed as: NIJS FRANS
2 granted patents·1 pending application·2 citations·filing 2005–2015
34Inventor score
Top patents by PatentIndex Score
3 records- 0162US9140546B2Apparatus and method for three dimensional inspection of wafer saw marksMAISON BENOIT·Filed 2011·Granted Sep 22, 2015·2 cites·28 claims
- 0237US2007023716A1Apparatus for three dimensional measuring on an electronic componentICOS VISION SYSTEMS NV·Filed 2005·Application pending·0 cites
- 0330US10215560B2Method for shape classification of an objectKLA TENCOR CORP·Filed 2015·Granted Feb 26, 2019·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →