Inventor · disambiguated record
Theodore Lundquist
Also filed as: LUNDQUIST THEODORE · LUNDQUIST THEODORE R · LUNDQUIST THEODORE RALPH
24 granted patents·10 pending applications·369 citations·filing 1996–2019
96Inventor score
Top patents by PatentIndex Score
34 records- 0194US7842920B2Methods and systems of performing device failure analysis, electrical characterization and physical characterizationDCG SYSTEMS INC·Filed 2007·Granted Nov 30, 2010·18 cites·24 claims
- 0294US7786436B1FIB based open via analysis and repairDCG SYSTEMS INC·Filed 2007·Granted Aug 31, 2010·78 cites·20 claims
- 0389US7135678B2Charged particle guideCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 14, 2006·52 cites·22 claims
- 0484US7883630B2FIB milling of copper over organic dielectricsDCG SYSTEMS INC·Filed 2008·Granted Feb 8, 2011·7 cites·16 claims
- 0582US7400154B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2005·Granted Jul 15, 2008·10 cites·37 claims
- 0682US7135123B1Method and system for integrated circuit backside navigationCREDENCE SYSTEMS CORP·Filed 2004·Granted Nov 14, 2006·30 cites·21 claims
- 0782US7115426B2Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrateCREDENCE SYSTEMS CORP·Filed 2005·Granted Oct 3, 2006·9 cites·19 claims
- 0882US5905266ACharged particle beam system with optical microscopeSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted May 18, 1999·46 cites·22 claims
- 0981US7060196B2FIB milling of copper over organic dielectricsCREDENCE SYSTEMS CORP·Filed 2003·Granted Jun 13, 2006·20 cites·49 claims
- 1075US7530034B2Apparatus and method for circuit operation definitionDCG SYSTEMS INC·Filed 2006·Granted May 5, 2009·10 cites·20 claims
- 1174US6943572B2Apparatus and method for detecting photon emissions from transistorsCREDENCE SYSTEMS CORP·Filed 2003·Granted Sep 13, 2005·15 cites·25 claims
- 1273US7884024B2Apparatus and method for optical interference fringe based integrated circuit processingDCG SYSTEMS INC·Filed 2007·Granted Feb 8, 2011·4 cites·20 claims
- 1367US6848087B2Sub-resolution alignment of imagesCREDENCE SYSTEMS CORP·Filed 2002·Granted Jan 25, 2005·13 cites·63 claims
- 1464US5840630AFBI etching enhanced with 1,2 di-iodo-ethaneSCHLUMBERGER TECHNOLOGIES INC·Filed 1996·Granted Nov 24, 1998·31 cites·16 claims
- 1563US10191111B2Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsetsDCG SYSTEMS INC·Filed 2014·Granted Jan 29, 2019·1 cites·39 claims
- 1663US7409653B2Sub-resolution alignment of imagesDCG SYSTEMS INC·Filed 2004·Granted Aug 5, 2008·9 cites·35 claims
- 1761US11047906B2Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsetsDCG SYSTEMS INC·Filed 2019·Granted Jun 29, 2021·0 cites·25 claims
- 1860US6905623B2Precise, in-situ endpoint detection for charged particle beam processingCREDENCE SYSTEMS CORP·Filed 2002·Granted Jun 14, 2005·3 cites·18 claims
- 1955US11114274B2Method and system for testing an integrated circuitZEISS CARL SMT GMBH·Filed 2019·Granted Sep 7, 2021·0 cites·28 claims
- 2052US7036109B1Imaging integrated circuits with focused ion beamCREDENCE SYSTEMS CORP·Filed 2002·Granted Apr 25, 2006·2 cites·29 claims
- 2151US10768224B2High frequency lock-in thermography using single photon detectorsFEI CO·Filed 2016·Granted Sep 8, 2020·0 cites·24 claims
- 2251US2006219949A1Fib milling of copper over organic dielectricsCREDENCE SYSTEMS CORP·Filed 2006·Application pending·0 cites
- 2349US7439168B2Apparatus and method of forming silicide in a localized mannerDCG SYSTEMS INC·Filed 2004·Granted Oct 21, 2008·7 cites·12 claims
- 2448US6872581B2Measuring back-side voltage of an integrated circuitNPTEST INC·Filed 2002·Granted Mar 29, 2005·4 cites·25 claims
- 2546US2005109956A1Precise, in-situ endpoint detection for charged particle beam processingFiled 2004·Application pending·0 cites
- 2645US7697146B2Apparatus and method for optical interference fringe based integrated circuit processingDCG SYSTEMS INC·Filed 2006·Granted Apr 13, 2010·0 cites·26 claims
- 2745US2008298719A1Sub-resolution alignment of imagesDCG SYSTEMS INC·Filed 2008·Application pending·0 cites
- 2841US2008028345A1Apparatus and method for integrated circuit design for circuit editCREDENCE SYSTEMS CORP·Filed 2007·Application pending·0 cites
- 2937US2004084408A1Method for surface preparation to enable uniform etching of polycrystalline materialsNPTEST INC·Filed 2003·Application pending·0 cites
- 3037US2004084407A1Method for surface preparation to enable uniform etching of polycrystalline materialsNPTEST INC·Filed 2002·Application pending·0 cites
- 3136US2002074494A1Precise, in-situ endpoint detection for charged particle beam processingFiled 2000·Application pending·0 cites
- 3235US2016370425A1Particle Beam Heating to Identify DefectsDCG SYSTEMS INC·Filed 2016·Application pending·0 cites
- 3334US2005024057A1Methods of using measured time resolved photon emission data and simulated time resolved photon emission data for fault localizationFiled 2004·Application pending·0 cites
- 3434US2004014401A1Method for backside die thinning and polishing of packaged integrated circuitsFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →