Inventor · disambiguated record
Wing L. Lai
Also filed as: LAI WING L
10 granted patents·3 pending applications·132 citations·filing 2003–2015
87Inventor score
Top patents by PatentIndex Score
13 records- 0194US7067886B2Method of assessing potential for charging damage in SOI designs and structures for eliminating potential for damageIBM·Filed 2003·Granted Jun 27, 2006·95 cites·15 claims
- 0290US9231072B2Multi-composition gate dielectric field effect transistorsIBM·Filed 2014·Granted Jan 5, 2016·10 cites·10 claims
- 0386US9190406B2Fin field effect transistors having heteroepitaxial channelsIBM·Filed 2014·Granted Nov 17, 2015·7 cites·20 claims
- 0484US9224826B2Multiple thickness gate dielectrics for replacement gate field effect transistorsIBM·Filed 2014·Granted Dec 29, 2015·6 cites·10 claims
- 0584US9099393B2Enabling enhanced reliability and mobility for replacement gate planar and FinFET structuresIBM·Filed 2013·Granted Aug 4, 2015·5 cites·14 claims
- 0663US7132318B2Method of assessing potential for charging damage in SOI designs and structures for eliminating potential for damageIBM·Filed 2004·Granted Nov 7, 2006·9 cites·12 claims
- 0752US9397175B2Multi-composition gate dielectric field effect transistorsGLOBALFOUNDRIES INC·Filed 2015·Granted Jul 19, 2016·0 cites·10 claims
- 0852US9368593B2Multiple thickness gate dielectrics for replacement gate field effect transistorsIBM·Filed 2015·Granted Jun 14, 2016·0 cites·10 claims
- 0950US2015228749A1Enabling enhanced reliability and mobility for replacement gate planar and finfet structuresIBM·Filed 2015·Application pending·0 cites
- 1050US2015249015A1Enabling enhanced reliability and mobility for replacement gate planar and finfet structuresIBM·Filed 2015·Application pending·0 cites
- 1149US2009112352A1Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2009·Application pending·0 cites
- 1247US9177868B2Annealing oxide gate dielectric layers for replacement metal gate field effect transistorsIBM·Filed 2014·Granted Nov 3, 2015·0 cites·20 claims
- 1344US7477961B2Equivalent gate count yield estimation for integrated circuit devicesIBM·Filed 2006·Granted Jan 13, 2009·0 cites·4 claims
Join the waitlist — get patent alerts
Get an alert when Wing L. Lai files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →