Inventor · disambiguated record
Ken Kinsun Lee
Also filed as: LEE KEN · LEE KEN K · LEE KEN KINSUN
46 granted patents·2 pending applications·2,006 citations·filing 1993–2022
99Inventor score
Top patents by PatentIndex Score
48 records- 0198US5479252ALaser imaging system for inspection and analysis of sub-micron particlesULTRAPOINTE CORP·Filed 1993·Granted Dec 26, 1995·343 cites·29 claims
- 0297US5963314ALaser imaging system for inspection and analysis of sub-micron particlesULTRAPOINTE CORP·Filed 1996·Granted Oct 5, 1999·258 cites·51 claims
- 0396US7729049B23-d optical microscopeZETA INSTR INC·Filed 2007·Granted Jun 1, 2010·37 cites·8 claims
- 0495US5672861AMethod and apparatus for automatic focusing of a confocal laser microscopeULTRAPOINTE CORP·Filed 1995·Granted Sep 30, 1997·163 cites·30 claims
- 0594US6288782B1Method for characterizing defects on semiconductor wafersULTRAPOINTE CORP·Filed 1999·Granted Sep 11, 2001·110 cites·18 claims
- 0693US7944609B23-D optical microscopeZETA INSTR INC·Filed 2010·Granted May 17, 2011·14 cites·34 claims
- 0793US5808735AMethod for characterizing defects on semiconductor wafersULTRAPOINTE CORP·Filed 1996·Granted Sep 15, 1998·146 cites·14 claims
- 0892US11536940B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Dec 27, 2022·2 cites·14 claims
- 0992US8174762B23-D optical microscopeXU JAMES JIANGUO·Filed 2010·Granted May 8, 2012·13 cites·12 claims
- 1091US7433031B2Defect review system with 2D scanning and a ring detectorCORE TECH OPTICAL INC·Filed 2004·Granted Oct 7, 2008·57 cites·6 claims
- 1191US5594235AAutomated surface acquisition for a confocal microscopeULTRAPOINTE CORP·Filed 1995·Granted Jan 14, 1997·108 cites·10 claims
- 1290US6661515B2Method for characterizing defects on semiconductor wafersKLA TENCOR CORP·Filed 2001·Granted Dec 9, 2003·42 cites·20 claims
- 1390US5783814AMethod and apparatus for automatically focusing a microscopeULTRAPOINTE CORP·Filed 1996·Granted Jul 21, 1998·86 cites·22 claims
- 1489US5923430AMethod for characterizing defects on semiconductor wafersULTRAPOINTE CORP·Filed 1997·Granted Jul 13, 1999·63 cites·25 claims
- 1588US6069690AIntegrated laser imaging and spectral analysis systemUNIPHASE CORP·Filed 1998·Granted May 30, 2000·102 cites·10 claims
- 1687US7110106B2Surface inspection systemCORETECH OPTICAL INC·Filed 2004·Granted Sep 19, 2006·43 cites·20 claims
- 1786US5483055AMethod and apparatus for performing an automatic focus operation for a microscopeFiled 1994·Granted Jan 9, 1996·62 cites·23 claims
- 1884US7384806B2Method for characterizing defects on semiconductor wafersKLA TENCOR CORP·Filed 2006·Granted Jun 10, 2008·9 cites·36 claims
- 1982US10048480B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesXU JAMES JIANGUO·Filed 2011·Granted Aug 14, 2018·4 cites·9 claims
- 2082US6650096B2Multiple phase switching regulator circuits sensing voltages across respective inductancesINTEL CORP·Filed 2002·Granted Nov 18, 2003·32 cites·10 claims
- 2181US10157457B2Optical measurement of opening dimensions in a waferZETA INSTR INC·Filed 2016·Granted Dec 18, 2018·4 cites·19 claims
- 2280US12265212B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2022·Granted Apr 1, 2025·0 cites·1 claims
- 2378US6402903B1Magnetic array for sputtering systemSTEAG HAMATECH AG·Filed 2000·Granted Jun 11, 2002·18 cites·33 claims
- 2477US6264804B1System and method for handling and masking a substrate in a sputter deposition systemSKE TECHNOLOGY CORP·Filed 2000·Granted Jul 24, 2001·19 cites·59 claims
- 2576US5761336AAperture optimization method providing improved defect detection and characterizationULTRAPOINTE CORP·Filed 1996·Granted Jun 2, 1998·46 cites·16 claims
- 2675US9036869B2Multi-surface optical 3D microscopeLEE KEN KINSUN·Filed 2011·Granted May 19, 2015·4 cites·19 claims
- 2775US8184364B2Illuminator for a 3-D optical microscopeXU JAMES JIANGUO·Filed 2008·Granted May 22, 2012·7 cites·5 claims
- 2874US9389408B23D microscope and methods of measuring patterned substratesHOU ZHEN·Filed 2011·Granted Jul 12, 2016·4 cites·28 claims
- 2973US8208290B2System and method to manufacture magnetic random access memoryRAO HARI M·Filed 2009·Granted Jun 26, 2012·6 cites·38 claims
- 3072US11294161B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2020·Granted Apr 5, 2022·0 cites·15 claims
- 3172US7154605B2Method for characterizing defects on semiconductor wafersKLA TENCOR CORP·Filed 2003·Granted Dec 26, 2006·10 cites·26 claims
- 3272US6534962B1Voltage regulator having an inductive current sensing elementINTEL CORP·Filed 2000·Granted Mar 18, 2003·19 cites·17 claims
- 3372US5845390AStructure of PM step motor and its fabricationFiled 1997·Granted Dec 8, 1998·47 cites·3 claims
- 3468US5884692ACooling device for central processing unit moduleHON HAI PREC IND CO LTD·Filed 1998·Granted Mar 23, 1999·37 cites·17 claims
- 3565US5943210ACooling device for central processing unit moduleHON HAI PREC IND CO LTD·Filed 1998·Granted Aug 24, 1999·33 cites·6 claims
- 3664US6631556B2Fixture to couple an integrated circuit to a circuit boardINTEL CORP·Filed 2001·Granted Oct 14, 2003·11 cites·32 claims
- 3764US6406598B2System and method for transporting and sputter coating a substrate in a sputter deposition systemSTEAG HAMATECH AG·Filed 2001·Granted Jun 18, 2002·6 cites·22 claims
- 3862US10884228B23D microscope including insertable components to provide multiple imaging and measurement capabilitiesKLA TENCOR CORP·Filed 2018·Granted Jan 5, 2021·0 cites·11 claims
- 3956US6413381B1Horizontal sputtering systemSTEAG HAMATECH AG·Filed 2000·Granted Jul 2, 2002·3 cites·52 claims
- 4054US5959350AFixing device for securing a heat sink to a CPU moduleHON HAI PREC IND CO LTD·Filed 1998·Granted Sep 28, 1999·20 cites·6 claims
- 4151US9664888B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 30, 2017·0 cites·20 claims
- 4250US9645381B2Multi-surface optical 3D microscopeZETA INSTR INC·Filed 2015·Granted May 9, 2017·0 cites·11 claims
- 4349US10209501B23D microscope and methods of measuring patterned substratesZETA INSTR INC·Filed 2016·Granted Feb 19, 2019·0 cites·15 claims
- 4449US2005105791A1Surface inspection methodFiled 2004·Application pending·0 cites
- 4546USH1530HSurface extraction from a three-dimensional data setULTRAPOINTE CORP·Filed 1993·Granted May 7, 1996·15 cites·9 claims
- 4644US8976366B2System and method for monitoring LED chip surface roughening processXU JAMES JIANGUO·Filed 2012·Granted Mar 10, 2015·0 cites·42 claims
- 4744US2006001914A1Color scanner displayMESMER RALPH M·Filed 2004·Application pending·0 cites
- 4843US6614136B2Voltage regulation system having an inductive current sensing elementINTEL CORP·Filed 2002·Granted Sep 2, 2003·3 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →