Inventor · disambiguated record
Junji Sugamoto
Also filed as: SUGAMOTO JUNJI
12 granted patents·2 pending applications·133 citations·filing 2002–2011
91Inventor score
Top patents by PatentIndex Score
14 records- 0192US7221991B2System and method for monitoring manufacturing apparatusesTOSHIBA KK·Filed 2005·Granted May 22, 2007·24 cites·9 claims
- 0289US7324855B2Process-state management system, management server and control server adapted for the system, method for managing process-states, method for manufacturing a product, and computer program product for the management serverTOSHIBA KK·Filed 2005·Granted Jan 29, 2008·24 cites·20 claims
- 0385US7529631B2Defect detection system, defect detection method, and defect detection programTOSHIBA KK·Filed 2007·Granted May 5, 2009·13 cites·19 claims
- 0485US7057259B2Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from themTOSHIBA KK·Filed 2002·Granted Jun 6, 2006·35 cites·38 claims
- 0580US7742834B2Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the sameTOSHIBA KK·Filed 2007·Granted Jun 22, 2010·11 cites·5 claims
- 0677US7700381B2Semiconductor wafer with ID mark, equipment for and method of manufacturing semiconductor device from themKABUSHIKIA KAISHA TOSHIBA·Filed 2006·Granted Apr 20, 2010·9 cites·1 claims
- 0771US7831330B2Process control system, process control method, and method of manufacturing electronic apparatusTOSHIBA KK·Filed 2009·Granted Nov 9, 2010·2 cites·10 claims
- 0865US7979154B2Method and system for managing semiconductor manufacturing deviceTOSHIBA KK·Filed 2007·Granted Jul 12, 2011·3 cites·2 claims
- 0964US7314766B2Semiconductor wafer treatment method, semiconductor wafer inspection method, semiconductor device development method and semiconductor wafer treatment apparatusTOSHIBA KK·Filed 2003·Granted Jan 1, 2008·9 cites·23 claims
- 1059US7596421B2Process control system, process control method, and method of manufacturing electronic apparatusKABUSHIK KAISHA TOSHIBA·Filed 2006·Granted Sep 29, 2009·2 cites·11 claims
- 1155US7970486B2Method for controlling semiconductor manufacturing apparatus and control system of semiconductor manufacturing apparatusTOSHIBA KK·Filed 2007·Granted Jun 28, 2011·1 cites·12 claims
- 1251US2011245956A1Method and system for managing semiconductor manufacturing deviceTOSHIBA KK·Filed 2011·Application pending·0 cites
- 1344US7531462B2Method of inspecting semiconductor waferTOSHIBA KK·Filed 2006·Granted May 12, 2009·0 cites·14 claims
- 1443US2007254482A1Method and system for manufacturing a semiconductor deviceKAWABATA KENJI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →