Inventor · disambiguated record
Yong-Hwan Noh
Also filed as: NOH YONG-HWAN
16 granted patents·2 pending applications·199 citations·filing 1999–2022
92Inventor score
Top patents by PatentIndex Score
18 records- 0194US6958947B2Semiconductor memory device with internal voltage generators for testing a memory array and peripheral circuitsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Oct 25, 2005·92 cites·20 claims
- 0282US6822330B2Semiconductor integrated circuit device with test element group circuitSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Nov 23, 2004·24 cites·15 claims
- 0378US6269050B1Internal clock generating circuit of synchronous type semiconductor memory device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jul 31, 2001·27 cites·24 claims
- 0476US7902871B2Level shifter and semiconductor device having off-chip driverSAMSUNG ELECTRONICS CO LTD·Filed 2010·Granted Mar 8, 2011·4 cites·6 claims
- 0562US7068058B2Semiconductor integrated circuit device with test element group circuitSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Jun 27, 2006·7 cites·2 claims
- 0660US6483770B2Synchronous semiconductor memory device and method for operating sameSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 19, 2002·11 cites·17 claims
- 0758US6674686B2Method and apparatus for read operation and write operation in semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Jan 6, 2004·10 cites·28 claims
- 0856US12417142B2Method of operating memory for having high reliability and memory of implementing the sameNETSOL CO LTD·Filed 2022·Granted Sep 16, 2025·0 cites·13 claims
- 0954US6456551B2Semiconductor memory device having prefetch operation mode and data transfer method for reducing the number of main data linesSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Sep 24, 2002·8 cites·20 claims
- 1053US6549994B1Semiconductor memory device capable of performing a write operation 1 or 2 cycles after receiving a write command without a dead cycleSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Apr 15, 2003·15 cites·31 claims
- 1150US12332746B2Method of restoring data and memory of performing the sameNETSOL CO LTD·Filed 2022·Granted Jun 17, 2025·0 cites·15 claims
- 1246US7801052B2Apparatus for measuring transmission delaySAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 21, 2010·0 cites·6 claims
- 1344US2009045844A1Level shifter and semiconductor device having off-chip driverSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1442US8030958B2System for providing a reference voltage to a semiconductor integrated circuitSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Oct 4, 2011·0 cites·8 claims
- 1537US7151710B2Semiconductor memory device with data input/output organization in multiples of nine bitsSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Dec 19, 2006·0 cites·21 claims
- 1637US6949960B2Semiconductor integrated circuit comprising functional modesSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 27, 2005·0 cites·14 claims
- 1736US6909661B2Semiconductor memory device with data input/output organization in multiples of nine bitsSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Jun 21, 2005·1 cites·36 claims
- 1836US2008175082A1Serial power capacitor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →