Inventor · disambiguated record
Shahid Butt
Also filed as: BUTT SHAHID · BUTT SHAHID A · BUTT SHAHID AHMAD
27 granted patents·7 pending applications·512 citations·filing 1999–2022
96Inventor score
Top patents by PatentIndex Score
34 records- 0198US6421820B1Semiconductor device fabrication using a photomask with assist featuresINFINEON TECHNOLOGIES AG·Filed 1999·Granted Jul 16, 2002·293 cites·44 claims
- 0292US9230637B1SRAM circuit with increased write marginGLOBALFOUNDRIES INC·Filed 2014·Granted Jan 5, 2016·20 cites·12 claims
- 0392US7439001B2Focus blur measurement and control methodIBM·Filed 2005·Granted Oct 21, 2008·13 cites·4 claims
- 0489US6940583B2Method and apparatus for amplitude filtering in the frequency plane of a lithographic projection systemINFINEON TECHNOLOGIES CORP·Filed 2003·Granted Sep 6, 2005·28 cites·20 claims
- 0586US10446442B2Integrated circuit chip with molding compound handler substrate and methodGLOBALFOUNDRIES INC·Filed 2016·Granted Oct 15, 2019·4 cites·20 claims
- 0684US6571383B1Semiconductor device fabrication using a photomask designed using modeling and empirical testingINFINEON TECHNOLOGIES AG·Filed 2000·Granted May 27, 2003·27 cites·51 claims
- 0781US8697514B2FinFET deviceBUTT SHAHID A·Filed 2011·Granted Apr 15, 2014·7 cites·14 claims
- 0879US7465615B1Polyconductor line end formation and related maskIBM·Filed 2007·Granted Dec 16, 2008·5 cites·1 claims
- 0977US7393703B2Method for reducing within chip device parameter variationsIBM·Filed 2006·Granted Jul 1, 2008·5 cites·22 claims
- 1067US7541613B2Methods for reducing within chip device parameter variationsIBM·Filed 2008·Granted Jun 2, 2009·2 cites·14 claims
- 1167US7074525B2Critical dimension control of printed features using non-printing fill patternsIBM·Filed 2003·Granted Jul 11, 2006·11 cites·36 claims
- 1267US6670646B2Mask and method for patterning a semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 30, 2003·8 cites·15 claims
- 1364US12300615B2Infrared debond damage mitigation by copper fill patternIBM·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 1464US7727825B2Polyconductor line end formation and related maskIBM·Filed 2008·Granted Jun 1, 2010·1 cites·15 claims
- 1564US7413833B2Single exposure of mask levels having a lines and spaces array using alternating phase-shift maskINFINEON TECHNOLOGIES AG·Filed 2004·Granted Aug 19, 2008·9 cites·51 claims
- 1663US7016027B2System and method for quantifying errors in an alternating phase shift maskINFINEON TECHNOLOGIES AG·Filed 2003·Granted Mar 21, 2006·4 cites·14 claims
- 1759US6606151B2Grating patterns and method for determination of azimuthal and radial aberrationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 12, 2003·8 cites·35 claims
- 1858US6282116B1Dynamic random access memoryINFINEON TECHNOLOGIES CORP·Filed 2000·Granted Aug 28, 2001·10 cites·16 claims
- 1955US6316168B1Top layer imaging lithography for semiconductor processingSIEMENS AG·Filed 1999·Granted Nov 13, 2001·19 cites·20 claims
- 2055US2009011346A1Focus blur measurement and control methodIBM·Filed 2008·Application pending·0 cites
- 2152US9059021B2FinFET deviceIBM·Filed 2014·Granted Jun 16, 2015·0 cites·6 claims
- 2251US6566219B2Method of forming a self aligned trench in a semiconductor using a patterned sacrificial layer for defining the trench openingINFINEON TECHNOLOGIES AG·Filed 2001·Granted May 20, 2003·4 cites·25 claims
- 2349US6842222B2Method of reducing pitch on semiconductor waferINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 11, 2005·3 cites·12 claims
- 2448US6114074AExtrusion enhanced mask for improving process windowSIEMENS AG·Filed 1999·Granted Sep 5, 2000·11 cites·21 claims
- 2547US7074529B2Phase-shift maskINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 11, 2006·1 cites·8 claims
- 2647US7056628B2Mask for projecting a structure pattern onto a semiconductor substrateINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jun 6, 2006·1 cites·15 claims
- 2745US6590657B1Semiconductor structures and manufacturing methodsINFINEON TECHNOLOGIES CORP·Filed 1999·Granted Jul 8, 2003·12 cites·4 claims
- 2845US2008169535A1Sub-lithographic faceting for mosfet performance enhancementIBM·Filed 2007·Application pending·0 cites
- 2945US2011101506A1Stress Memorization Technique Using Silicon SpacerIBM·Filed 2009·Application pending·0 cites
- 3043US2005009312A1Gate length proximity corrected deviceIBM·Filed 2003·Application pending·0 cites
- 3140US2008157200A1Stress liner surrounded facetless embedded stressor mosfetIBM·Filed 2006·Application pending·0 cites
- 3239US6118683ADynamic random access memory cell layoutINFINEON TECHNOLOGIES CORP·Filed 1999·Granted Sep 12, 2000·6 cites·7 claims
- 3336US2018166356A1Fan-out circuit packaging with integrated lidGLOBALFOUNDRIES INC·Filed 2016·Application pending·0 cites
- 3434US2005168753A1Optical measurement of device features using interferometric illuminationINFINEON TECHNOLOGIES CORP·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →