Inventor · disambiguated record
Toshihiro Yonezawa
Also filed as: YONEZAWA TOSHIHIRO
12 granted patents·2 pending applications·398 citations·filing 1995–2008
91Inventor score
Top patents by PatentIndex Score
14 records- 0195US5999268AApparatus for aligning a semiconductor wafer with an inspection contactorTOKYO ELECTRON LTD·Filed 1997·Granted Dec 7, 1999·146 cites·6 claims
- 0293US6084215ASemiconductor wafer holder with spring-mounted temperature measurement apparatus disposed thereinTOKYO ELECTRON LTD·Filed 1998·Granted Jul 4, 2000·163 cites·6 claims
- 0380US7649369B2Probe and method of manufacturing probeOCTEC INC·Filed 2005·Granted Jan 19, 2010·7 cites·2 claims
- 0471US5708222AInspection apparatus, transportation apparatus, and temperature control apparatusTOKYO ELECTRON LTD·Filed 1995·Granted Jan 13, 1998·47 cites·4 claims
- 0567US7847569B2Probe device and method of regulating contact pressure between object to be inspected and probeTOKYO ELECTRON LTD·Filed 2006·Granted Dec 7, 2010·3 cites·7 claims
- 0667US6831455B2Mechanism for fixing probe cardTOKYO ELECTRON LTD·Filed 2003·Granted Dec 14, 2004·9 cites·7 claims
- 0762USRE42655EMechanism for fixing probe cardTOKYO ELECTRON LTD·Filed 2006·Granted Aug 30, 2011·1 cites·13 claims
- 0861US8674717B2Cantilevered probe having a bending contactYONEZAWA TOSHIHIRO·Filed 2008·Granted Mar 18, 2014·4 cites·1 claims
- 0955USRE42115EMechanism for fixing probe cardTOKYO ELECTRON LTD·Filed 2007·Granted Feb 8, 2011·0 cites·15 claims
- 1050US6205652B1Vacuum coupling systemTOKYO ELECTRON LTD·Filed 1999·Granted Mar 27, 2001·17 cites·24 claims
- 1144US8415964B2Probe card having a structure for being prevented from deformingYONEZAWA TOSHIHIRO·Filed 2008·Granted Apr 9, 2013·1 cites·8 claims
- 1235US8319511B2Probe device having a structure for being prevented from deformingYONEZAWA TOSHIHIRO·Filed 2008·Granted Nov 27, 2012·0 cites·4 claims
- 1334US2002014894A1Temperature control apparatusFiled 2001·Application pending·0 cites
- 1434US2008048698A1Probe CardAMEMIYA TAKASHI·Filed 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Toshihiro Yonezawa files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →