Inventor · disambiguated record
Mark D. Dimanna
Also filed as: DIMANNA MARK · DIMANNA MARK D
10 granted patents·2 pending applications·41 citations·filing 2004–2024
85Inventor score
Top patents by PatentIndex Score
12 records- 0190US7601976B2Dual beam systemFEI CO·Filed 2006·Granted Oct 13, 2009·10 cites·22 claims
- 0288US7161159B2Dual beam systemFEI CO·Filed 2004·Granted Jan 9, 2007·22 cites·3 claims
- 0384US8013311B2Dual beam systemFEI CO·Filed 2009·Granted Sep 6, 2011·5 cites·9 claims
- 0474US8399864B2Dual beam systemHILL RAYMOND·Filed 2011·Granted Mar 19, 2013·2 cites·7 claims
- 0569US8633451B2Ion sources, systems and methodsWARD BILLY W·Filed 2008·Granted Jan 21, 2014·2 cites·18 claims
- 0665US12270774B2System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particlesZEISS CARL SMT GMBH·Filed 2024·Granted Apr 8, 2025·0 cites·20 claims
- 0760US9530611B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 27, 2016·0 cites·19 claims
- 0860US9530612B2Charged particle beam system and method of operating a charged particle beam systemCARL ZEISS MICROSCOPY LLC·Filed 2014·Granted Dec 27, 2016·0 cites·28 claims
- 0954US2023402251A1Gas injection subsystem for use in an inspection system to inspect a sample by use of charged particles and inspection system having such gas injection subsystemZEISS CARL SMT GMBH·Filed 2023·Application pending·0 cites
- 1050US12044638B2System to inspect, modify or analyze a region of interest of a sample by charged particles, set of systems to inspect, modify or analyze a region of interest of a sample and method to inspect, modify or analyze a region of interest of a sample by charged particlesZEISS CARL SMT GMBH·Filed 2021·Granted Jul 23, 2024·0 cites·20 claims
- 1139US2013118184A1Cooled charged particle systems and methodsGROHOLSKI ALEXANDER·Filed 2012·Application pending·0 cites
- 1236US8993981B2Charged particle source with light monitoring for tip temperature determinationNOTTE IV JOHN·Filed 2011·Granted Mar 31, 2015·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →