Inventor · disambiguated record
Tyler Rockwell
Also filed as: ROCKWELL TYLER · ROCKWELL TYLER B · ROCKWELL TYLER BURTON
13 granted patents·3 pending applications·39 citations·filing 2006–2023
88Inventor score
Files withAPPLIED MATERIALS INC6VARIAN SEMICONDUCTOR EQUIPMENT ASS INC6VARIAN SEMICONDUCTOR EQUIPMENT4
Top patents by PatentIndex Score
16 records- 0190US10276340B1Low particle capacitively coupled components for workpiece processingVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Granted Apr 30, 2019·6 cites·18 claims
- 0288US9514912B2Control of ion angular distribution of ion beams with hidden deflection electrodeVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2014·Granted Dec 6, 2016·9 cites·20 claims
- 0386US11056319B2Apparatus and system having extraction assembly for wide angle ion beamAPPLIED MATERIALS INC·Filed 2019·Granted Jul 6, 2021·5 cites·17 claims
- 0486US7675047B2Technique for shaping a ribbon-shaped ion beamVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2006·Granted Mar 9, 2010·9 cites·20 claims
- 0581US10224181B2Radio frequency extraction system for charge neutralized ion beamVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2016·Granted Mar 5, 2019·3 cites·13 claims
- 0679US9865433B1Gas injection system for ion beam deviceVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Granted Jan 9, 2018·2 cites·20 claims
- 0778US7723697B2Techniques for optical ion beam metrologyVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2007·Granted May 25, 2010·4 cites·17 claims
- 0875US12400824B2Ion extraction optics having novel blocker configurationAPPLIED MATERIALS INC·Filed 2022·Granted Aug 26, 2025·0 cites·20 claims
- 0962US8698108B1Ion beam measurement system and methodVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2013·Granted Apr 15, 2014·1 cites·18 claims
- 1058US12106943B2Substrate halo arrangement for improved process uniformityAPPLIED MATERIALS INC·Filed 2021·Granted Oct 1, 2024·0 cites·9 claims
- 1158US2025157833A1Cold plate for trapping etching and deposition byproductsAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1252US12191117B2Compact low angle ion beam extraction assembly and processing apparatusAPPLIED MATERIALS INC·Filed 2021·Granted Jan 7, 2025·0 cites·16 claims
- 1348US8907300B2System and method for plasma control using boundary electrodeVARIAN SEMICONDUCTOR EQUIPMENT·Filed 2013·Granted Dec 9, 2014·0 cites·21 claims
- 1446US2023197422A1Fastening assembly for beam blocker in ion processing apparatusAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 1542US10193066B2Apparatus and techniques for anisotropic substrate etchingVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2017·Granted Jan 29, 2019·0 cites·17 claims
- 1640US2019272983A1Substrate halo arrangement for improved process uniformityVARIAN SEMICONDUCTOR EQUIPMENT ASS INC·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →