Inventor · disambiguated record
Steven H. Lamphier
Also filed as: LAMPHIER STEVEN · LAMPHIER STEVEN H · LAMPHIER STEVEN HARLEY
10 granted patents·2 pending applications·413 citations·filing 1995–2023
90Inventor score
Top patents by PatentIndex Score
12 records- 0196US5666078AProgrammable impedance output driverIBM·Filed 1996·Granted Sep 9, 1997·229 cites·9 claims
- 0294US7643357B2System and method for integrating dynamic leakage reduction with write-assisted SRAM architectureIBM·Filed 2008·Granted Jan 5, 2010·40 cites·20 claims
- 0393US6219288B1Memory having user programmable AC timingsIBM·Filed 2000·Granted Apr 17, 2001·96 cites·14 claims
- 0477US7403061B2Method of improving fuse state detection and yield in semiconductor applicationsIBM·Filed 2006·Granted Jul 22, 2008·7 cites·16 claims
- 0567US10062445B2Parallel programming of one time programmable memory array for reduced test timeGLOBALFOUNDRIES INC·Filed 2016·Granted Aug 28, 2018·2 cites·20 claims
- 0663US5659508ASpecial mode enable transparent to normal mode operationIBM·Filed 1995·Granted Aug 19, 1997·32 cites·19 claims
- 0760US8611169B2Fine granularity power gatingHOULE ROBERT M·Filed 2011·Granted Dec 17, 2013·3 cites·22 claims
- 0857US12442855B1Built-in circuit for testing process and layout effects of an integrated circuit dieMARVELL ASIA PTE LTD·Filed 2023·Granted Oct 14, 2025·0 cites·20 claims
- 0953US7068105B2Low-voltage differential amplifierIBM·Filed 2005·Granted Jun 27, 2006·2 cites·15 claims
- 1049US2008265982A1Method of improving fuse state detection and yield in semiconductor applicationsIBM·Filed 2008·Application pending·0 cites
- 1144US2009153228A1Structure for improving fuse state detection and yield in semiconductor applicationsIBM·Filed 2007·Application pending·0 cites
- 1241US6975169B2Low-voltage differential amplifierIBM·Filed 2004·Granted Dec 13, 2005·2 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →