Inventor · disambiguated record
Ami Sade
Also filed as: SADE AMI
4 granted patents·11 citations·filing 2002–2020
64Inventor score
Files withAPPLIED MATERIALS INC4
Top patents by PatentIndex Score
4 records- 0167US7133549B2Local bias map using line width measurementsAPPLIED MATERIALS INC·Filed 2002·Granted Nov 7, 2006·10 cites·32 claims
- 0259US7486814B2Local bias map using line width measurementsAPPLIED MATERIALS INC·Filed 2006·Granted Feb 3, 2009·1 cites·37 claims
- 0351US11047039B2Substrate carrier having hard maskAPPLIED MATERIALS INC·Filed 2018·Granted Jun 29, 2021·0 cites·20 claims
- 0450US11204312B2In-situ full wafer metrology systemAPPLIED MATERIALS INC·Filed 2020·Granted Dec 21, 2021·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →